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Volume 19 - August 2013

Contents

Page 43 of 70

Instrumentation Sciences

A12.01 Atom Probe Tomography In Correlative Investigations

Abstract

  • Application of a Generalized Approach for APT Simulation: Investigations on Disordered and Complex Sample Structures

  • C. Oberdorfer, S.M. Eich, G. Schmitz
  • Published online by Cambridge University Press:
    09 October 2013, pp. 928-929
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A Level Set Evaporation Model for Heterogeneous Atom Probe Tip

  • Z. Xu, D. Li, W. Xu, A. Devaraj, R. Colby, S. Thevuthasan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 934-935
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A12.02 Atom Probe Tomography In Correlative Investigations

Abstract

  • Progress in Planar Feature Spatial Reconstruction for Atom Probe Tomography

  • B.P. Geiser, D.J. Larson, T.J. Prosa, T.F. Kelly
  • Published online by Cambridge University Press:
    09 October 2013, pp. 936-937
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Direct Experimental Measurement of Grain Boundary's Five-Parameters and Solute Segregations at Atomic Level

  • L. Yao, M.K. Miller
  • Published online by Cambridge University Press:
    09 October 2013, pp. 938-939
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Measuring Chemical Segregation at Grain Boundaries by Atom Probe Tomography

  • M. Bachhav, Y. Chen, E. Marquis, B. Geiser
  • Published online by Cambridge University Press:
    09 October 2013, pp. 940-941
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Novel Insights into In-Service Oxidized Inconel 625 Engine Exhausts by a Multi-Technique Approach

  • P.A. Bagot, P.E. Edmondson, G.M. Hughes, A. Crossley, D. De Lille
  • Published online by Cambridge University Press:
    09 October 2013, pp. 942-943
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A12.03 Atom Probe Tomography In Correlative Investigations

Abstract

  • Combining Structural and Chemical Information on the Nanometer Scale by Correlative TEM and APT

  • M. Herbig, P.-P. Choi, D. Raabe
  • Published online by Cambridge University Press:
    09 October 2013, pp. 948-949
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom Counting in Atom Probe Tomography Specimens Using Quantitative HAADF-STEM

  • W. Lefebvre
  • Published online by Cambridge University Press:
    09 October 2013, pp. 950-951
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Towards Atom Probe Tomography of Hybrid Organic-Inorganic Nanoparticles

  • L.M. Gordon, M.J. Cohen, D. Joester
  • Published online by Cambridge University Press:
    09 October 2013, pp. 952-953
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Microencapsulation Method for Atom Probe Analysis of Powders

  • D.C. Bell, A.P. Magyar, A. Graham, M. Baram
  • Published online by Cambridge University Press:
    09 October 2013, pp. 954-955
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A12.04 Atom Probe Tomography In Correlative Investigations

Abstract

  • Atom Probe Tomography of III-Nitrides Based Semiconducting Devices

  • R. Shivaraman, Y.-R. Wu, S. Choi, R. Chung, J. Speck
  • Published online by Cambridge University Press:
    09 October 2013, pp. 956-957
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom-Probe Tomographic Study of Interfacial Intermixing and Segregation in InAs/GaSb Superlattices

  • Y. Meng, H. Kim, D. Isheim, D.N. Seidman, J.-M. Zuo
  • Published online by Cambridge University Press:
    09 October 2013, pp. 958-959
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Characterization of 3D Dopant Distribution in State of the Art FinFET Structures

  • M.S. Hatzistergos, M. Hopstaken, E. Kim, L. Vanamurthy, J.F. Shaffer
  • Published online by Cambridge University Press:
    09 October 2013, pp. 960-961
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom Probe Tomography of Grain Boundaries in Ion Conducting Oxides

  • D.R. Diercks, B.P. Gorman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 962-963
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A12.05 Atom Probe Tomography In Correlative Investigations

Abstract

Page 43 of 70