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A Correlative Atom-Probe Tomography and Transmission Electron Microscope Study of a Thermally Grown Oxide on a Commercial Nickel-Based Superalloy, René N'5 Y+®

Published online by Cambridge University Press:  09 October 2013

S.-I. Baik ,
X. Yin  and
D.N. Seidman
S.-I. Baik
Affiliation:
X. Yin
Affiliation:
D.N. Seidman
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 966 - 967
Copyright
Copyright © Microscopy Society of America 2013