Microscopy and Microanalysis: Volume 19 -

Fission Products in Nuclear Fuel: Comparison of Simulated Distribution with Correlative Characterization Techniques
B. Valderrama, H.B. Henderson, L. He, C. Yablinsky, J. Gan, A.-R. Hassan, A. El-Azab, T.R. Allen, M.V. Manuel
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09 October 2013, pp. 968-969
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Complementary Atom Probe Tomography and Electron Microscopy of Oxidation of Ni-Base Alloys in High-Temperature Water Environments
D.K. Schreiber, M.J. Olszta, S.M. Bruemmer
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09 October 2013, pp. 970-971
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A Correlated APT and TEM Approach to Understand Nanostructured Ferritic Alloys
M.K. Miller, C.M. Parish, L. Yao
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09 October 2013, pp. 972-973
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Combining Atom-Probe Tomography and Focused-Ion Beam Microscopy to Study Individual Presolar Meteoritic Nanodiamond Particles
D. Isheim, F.J. Stadermann, J.B. Lewis, C. Floss, T.L. Daulton, A.M. Davis, P.R. Heck, M.J. Pellin, M.R. Savina, D.N. Seidman, T. Stephan
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09 October 2013, pp. 974-975
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Mapping the Complex Phase Formation at the Surface of Supercritical CO Reacted Fayalite for Geologic Sequestration of Greenhouse Gases
D.E. Perea, J. Liu, B. Arey, L. Kovarik, R. Colby, O. Qafoku, T. Thevuthasan, A.R. Felmy
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09 October 2013, pp. 976-977
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Elemental and Isotopic Tomography at Single-Atom-Scale in 4000 and 2400 Ma Zircons
D.A. Reinhard, J.W. Valley, T. Ushikubo, A. Strickland, D. Snoeyenbos, D. Lawrence, I. Martin, D.J. Larson, T.F. Kelly, A.J. Cavoise
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09 October 2013, pp. 978-979
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Atomic Scale Composition Profiling of Ferroelectrics via Laser-Pulsed Atom Probe Tomography and Cross-Correlative Transmission Electron Microscopy
R. Kirchhofer, D.R. Diercks, B.P. Gorman, G.L. Brennecka
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09 October 2013, pp. 980-981
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Understanding Mineral Carbonate Formation under Supercritical Conditions using Electron Microscopy and Atom Probe Tomography
B.W. Arey, D.E. Perera, L. Kovarik, R.J. Colby, O. Qafoku, A.R. Felmy
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09 October 2013, pp. 982-983
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Atom Probe Tomography: Beyond the Microscope, a Breakthrough Backdoor for Chemical, Physical and Functional Characterization at the Nanometer Scale
F. Vurpillot, A. Gaillard, L. Arnoldi, A. Vella, L. Rigutti, V. Tognetti, B. Deconihout
Published online by Cambridge University Press:

09 October 2013, pp. 984-985
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Multi-Region Data Simulation for Detection Limit Investigations in IVAS™
R.M. Ulfig, B.P. Geiser, T.J. Prosa, D.J. Larson, J. Leroux, B. Dupont
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09 October 2013, pp. 986-987
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

The Effects of Detector Efficiency on Distinguishing Solute Atoms in Random Solid Solution and Solute Clusters
M.K. Miller, L. Yao
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09 October 2013, pp. 988-989
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Voltage and Laser-Assisted Mode Atom Probe Tomography of Gallium Nitride
N. Dawahre, G. Shen, S.M. Kim, P. Kung
Published online by Cambridge University Press:

09 October 2013, pp. 990-991
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Gaussian Kernel Density Estimator for Voxel Size Selection in Atom Probe Tomography
K. Kaluskar, K. Rajan
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09 October 2013, pp. 992-993
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Improved Mass Resolving Power and Yield in Atom Probe Tomography
D.J. Larson, T.J. Prosa, J.H. Bunton, D.P. Olson, D.F. Lawrence, E. Oltman, S.N. Strennin, T.F. Kelly
Published online by Cambridge University Press:

09 October 2013, pp. 994-995
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A Weibull Perspective on the Fracture of Atom Probe Specimens
B. Gault, O. Bouaziz
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09 October 2013, pp. 996-997
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Simulation-Enhanced Atom Probe for Complete 3D Atomistic Imaging
M.P. Moody, A.V. Ceguerra, A.J. Breen, B. Gault, X.Y. Cui, L.T. Stephenson, R.K. Marceau, R. Powles, S.P. Ringer
Published online by Cambridge University Press:

09 October 2013, pp. 998-999
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Using Spatial Distribution Maps to Estimate APT Efficiency
B.P. Geiser, D.J. Larson, T.J. Prosa, T.F. Kelly, R.M. Ulfig
Published online by Cambridge University Press:

09 October 2013, pp. 1000-1001
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

An Integrated Data Driven Reconstruction and Molecular Dynamics Simulation for Lattice Structure in Atom Probe Tomography
J. Peralta, K. Kaluskar, C. Loyola, K. Rajan
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09 October 2013, pp. 1002-1003
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Electric Field Induced Changes in Surface Bonding: Integrating First Principles and Atom Probe Tomography
C. Loyola, J. Peralta, S. Broderick, K. Rajan
Published online by Cambridge University Press:

09 October 2013, pp. 1004-1005
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Stability of Oxygen-Enriched Nanoclusters and Helium Bubbles in Fe-Based Alloys under Extreme Conditions
M.K. Miller, C.-L. Fu, X. Chen, Q. Li
Published online by Cambridge University Press:

09 October 2013, pp. 1006-1007
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Volume 19 - August 2013

Instrumentation Sciences

A12.05 Atom Probe Tomography In Correlative Investigations

Abstract

Fission Products in Nuclear Fuel: Comparison of Simulated Distribution with Correlative Characterization Techniques

Complementary Atom Probe Tomography and Electron Microscopy of Oxidation of Ni-Base Alloys in High-Temperature Water Environments

A Correlated APT and TEM Approach to Understand Nanostructured Ferritic Alloys

A12.06 Atom Probe Tomography In Correlative Investigations

Abstract

Combining Atom-Probe Tomography and Focused-Ion Beam Microscopy to Study Individual Presolar Meteoritic Nanodiamond Particles

Mapping the Complex Phase Formation at the Surface of Supercritical CO Reacted Fayalite for Geologic Sequestration of Greenhouse Gases

Elemental and Isotopic Tomography at Single-Atom-Scale in 4000 and 2400 Ma Zircons

Atomic Scale Composition Profiling of Ferroelectrics via Laser-Pulsed Atom Probe Tomography and Cross-Correlative Transmission Electron Microscopy

Understanding Mineral Carbonate Formation under Supercritical Conditions using Electron Microscopy and Atom Probe Tomography

A12.P1 Atom Probe Tomography In Correlative Investigations

Abstract

Atom Probe Tomography: Beyond the Microscope, a Breakthrough Backdoor for Chemical, Physical and Functional Characterization at the Nanometer Scale

Multi-Region Data Simulation for Detection Limit Investigations in IVAS™

The Effects of Detector Efficiency on Distinguishing Solute Atoms in Random Solid Solution and Solute Clusters

Voltage and Laser-Assisted Mode Atom Probe Tomography of Gallium Nitride

Gaussian Kernel Density Estimator for Voxel Size Selection in Atom Probe Tomography

Improved Mass Resolving Power and Yield in Atom Probe Tomography

A Weibull Perspective on the Fracture of Atom Probe Specimens

Simulation-Enhanced Atom Probe for Complete 3D Atomistic Imaging

Using Spatial Distribution Maps to Estimate APT Efficiency

An Integrated Data Driven Reconstruction and Molecular Dynamics Simulation for Lattice Structure in Atom Probe Tomography

Electric Field Induced Changes in Surface Bonding: Integrating First Principles and Atom Probe Tomography

Stability of Oxygen-Enriched Nanoclusters and Helium Bubbles in Fe-Based Alloys under Extreme Conditions

Microscopy and Microanalysis

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Volume 19 - August 2013

Instrumentation Sciences

A12.05 Atom Probe Tomography In Correlative Investigations

Abstract

A12.06 Atom Probe Tomography In Correlative Investigations

Abstract

A12.P1 Atom Probe Tomography In Correlative Investigations

Abstract