Measuring Chemical Segregation at Grain Boundaries by Atom Probe Tomography

M. Bachhav; Y. Chen; E. Marquis; B. Geiser

doi:10.1017/S1431927613006697

Measuring Chemical Segregation at Grain Boundaries by Atom Probe Tomography

Published online by Cambridge University Press: 09 October 2013

M. Bachhav ,

Y. Chen ,

E. Marquis and

B. Geiser

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M. Bachhav: Affiliation:
Y. Chen: Affiliation:
E. Marquis: Affiliation:
B. Geiser: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 940 - 941

DOI: https://doi.org/10.1017/S1431927613006697 [Opens in a new window]

Article contents

Measuring Chemical Segregation at Grain Boundaries by Atom Probe Tomography

Abstract

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