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Volume 19 - August 2013

Contents

Page 46 of 70

Instrumentation Sciences

A13.02 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Quantitative Analysis of Carbon in Carbon Steel Using SEM/EDS Followed by Error Correction Approach

  • L. Zou, Q. Zhou
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1048-1049
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Examination of Polycrystalline Diamond Compact Cutter used in Drilling Tools in the Oil Industry

  • J.N. Williard, D.K. Colbert
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1050-1051
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Single Crystal Elastic Constants of TWIP Steel Determined From Nanoindentation

  • D.T. Pierce, K. Nowag, A. Montagne, J.A. Jimenez, J.E. Wittig, R. Ghisleni
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1052-1053
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A13.03 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Discovery: Under the Microscope at Kennedy Space Center

  • P.M. Howard
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1054-1055
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Understanding Complex Material Systems Using Multiple Characterization Techniques

  • S. Addepalli, S. Thimmegowda
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1056-1057
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Integrated Nonlinear Optical Microscope for Crystal Centering on a Synchrotron X-ray Beamline

  • J.A. Newman, S.J. Toth, C.M. Dettmar, M. Becker, R.F. Fischetti, G.J. Simpson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1058-1059
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low kV Imaging using Charge Balancing

  • K. Png
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1060-1061
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Microscopy Method for Characterization Oil Uptake in Fried Foods

  • D.M. Williams, J. Guo, R. Fletcher
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1062-1063
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A13.04 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Understanding the Effects of Wear Particles: Lessons Learned from Postmortem Retrievals

  • D.J. Hall, R.M. Urban, J.O. Galante, J.J. Jacobs
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1064-1065
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Use of an Automated SEM to Detect Laboratory Contamination

  • A.P. Lindstrom, N.W. Ritchie, D.E. Newbury
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1066-1067
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Quantitative X-ray Photoelectron Spectroscopy Imaging for Small Feature Compositional Screening

  • D.J. Surman, S.C. Page, A.J. Roberts, S.J. Coultas
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1068-1069
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Ultra-thin Iridium as a Replacement Coating for Carbon in High Resolution Quantitative Analyses of Insulating Specimens

  • J.T. Armstrong, K.L. Crispin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1070-1071
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Focused Electron Beam and Elemental Mapping of Palm-top EPMA (Scanning) Equipped with CL Spectrometer (Projection)

  • S. Imashuku, N. Fuyuno, A. Imanishi, K. Hanasaki, K. Ohira, J. Kawai
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1072-1073
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A13.05 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Getting Back to the Basics. Parameters that Must be Considered Before Attempting Quantitative EDS Analysis in the TEM

  • N. Rowlands, E.F. Schumacher, A.W. Nicholls
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1074-1075
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Nanometer-scale Characterization Tools for Strain-Engineered Semiconductor Devices

  • V.B. Ozdol, C.T. Koch, A.M. Minor
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1076-1077
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Quantitation of Overlapping Core Edges in EFTEM Spectrum Imaging of Cells

  • R.D. Leapman, M.A. Aronova
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1078-1079
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Determination of the Optical Properties of Carbonaceous Aerosols by Monochromated Electron Energy-loss Spectroscopy

  • J. Zhu, P.A. Crozier, J.R. Anderson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1080-1081
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electron Microscopy of Graphene Materials Produced by Combustion Synthesis

  • S. Rouvimov, K.V. Manukyan, A.S. Mukasyan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1082-1083
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Direct High Resolution Cryo-TEM Imaging of Liquid Crystals

  • M. Gao, C. Zhang, H.-S. Park, A. Jakli, O.D. Lavrentovich
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1084-1085
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A13.06 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Forensic Gemmology in Forensic Practice

  • M. Kotrly, I. Turkova
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1086-1087
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 46 of 70