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Volume 19 - August 2013

Contents

Page 41 of 70

Instrumentation Sciences

A10.P1 Practical Programming for Microanalysis

Abstract

  • Electron Microprobe Quantitative Mapping vs. Defocused Beam Analysis

  • J.E. Barkman, P. Carpenter, J.-C. Zhao, J.J. Donovan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 848-849
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Simulation of Incoherent Scattering in High-Angle Annular Dark-Field Scanning Electron Microscopy

  • A. Dutta, C. Reid, H. Heinrich
  • Published online by Cambridge University Press:
    09 October 2013, pp. 852-853
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A11.01 Ion Beam Instrumentation and Applications for Physical and Biological Sciences

Abstract

  • Orion NanoFab - 2nd Generation Helium Ion Microscope

  • D.C. Joy, B.J. Griffin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 854-855
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Application of Helium Ion Microscope for Sample Modification at Nanoscale

  • M. Rudneva, E. van Veldhoven, S.K. Malladi, H.W. Zandbergen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 856-857
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Nanoscale Phase Patterning in a Sr-Doped Lanthanum Cobaltite Thin Film

  • D.N. Leonard, D.A. Cullen, K. Klein
  • Published online by Cambridge University Press:
    09 October 2013, pp. 858-859
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Fast 3D Tomography of C4 Solder Bump by Using Xe Plasma Focused Ion Beam

  • T. Hrncir, L. Hladik, J. Jiruse, F. Lopour
  • Published online by Cambridge University Press:
    09 October 2013, pp. 860-861
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Xe+ FIB Milling and Measurement of Amorphous Silicon Damage

  • R.D. Kelley, K. Song, B. Van Leer, D. Wall, L. Kwakman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 862-863
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A11.02 Ion Beam Instrumentation and Applications for Physical and Biological Sciences

Abstract

  • EBSD Imaging of Femtosecond Laser Ablated Surfaces Using the TriBeam System

  • M.P. Echlin, M. Titus, S. Kraemer, T. Pollock
  • Published online by Cambridge University Press:
    09 October 2013, pp. 864-865
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • New Approach For Rapid Prototyping Using The Combination of Pulsed Laser Ablation and FIB Milling

  • R. Salzer
  • Published online by Cambridge University Press:
    09 October 2013, pp. 866-867
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Advances in S/TEM Sample Preparation Using a FIB-SEM: Techniques for the Ultimate Sample

  • B. Van Leer, D. Wall
  • Published online by Cambridge University Press:
    09 October 2013, pp. 868-869
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Focused Ion Beam Slice-and-View Tomography and Correlative Electron Microscopy of Multiphase Meteorite Particles

  • N.D. Bassim, R.M. Stroud, K. Scott, L.R. Nittler, C.D. Herd
  • Published online by Cambridge University Press:
    09 October 2013, pp. 870-871
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A11.03 Ion Beam Instrumentation and Applications for Physical and Biological Sciences

Abstract

  • Focussed Ion Beam Scanning Electron Microscopy in Biology

  • C. Kizilyaprak, C. Loussert, J. Daraspe, B.M. Humbel
  • Published online by Cambridge University Press:
    09 October 2013, pp. 874-875
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Progress in Cryo-FIB Preparation of Biological Specimens for Cryo-TEM

  • M. Marko, C. Hsieh, T. Wagenknecht
  • Published online by Cambridge University Press:
    09 October 2013, pp. 880-881
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Use of Focused Ion Beam (FIB) Technology for Cell Wall Structure Elucidation

  • M. Blumentritt, S.D. Collins, S.M. Shaler
  • Published online by Cambridge University Press:
    09 October 2013, pp. 882-883
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A11.04 Ion Beam Instrumentation and Applications for Physical and Biological Sciences

Abstract

  • Understanding Microstructural Changes in Metals Induced by Gallium Ion Beam Irradiation

  • J.R. Michael
  • Published online by Cambridge University Press:
    09 October 2013, pp. 884-885
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Switching of the Natural Nanostructure in Bi2Te3 Bulk Materials by Low Energy Ion Irradiation

  • Z. Aabdin, N. Peranio, O. Eibl
  • Published online by Cambridge University Press:
    09 October 2013, pp. 886-887
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 41 of 70