Proceedings of Microscopy & Microanalysis 2017
Physical Science Symposia
Advanced Microscopy and Microanalysis of Low-Dimensional Structures and Devices
Abstract
Probing Strain-Induced Phenomena in Low Dimensionality Multiferroic Oxides
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- 04 August 2017, pp. 1726-1727
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Atomic Scale Structure and Defects in 2D GaSe Films and Van der Waals Interface
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- 04 August 2017, pp. 1728-1729
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Ge Nanowires: Sn Catalysts and Ge/Ge1-xSnx Core-Shell Structures
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- 04 August 2017, pp. 1730-1731
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Structural and Magnetic Characterization of B20 Skyrmion Thin Films and Heterostructures Using Aberration-Corrected Lorentz TEM and Differential Phase Contrast STEM
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- 04 August 2017, pp. 1732-1733
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Lorentz TEM Image Simulations of Dzyaloshinskii Domain Walls Under an In-Plane Magnetic Field
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- 04 August 2017, pp. 1734-1735
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Electron-Beam-Induced Deposition of Carbon Nanorod via Spot Mode as Highly Stable and Sensitive AFM Probe Tip
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- 04 August 2017, pp. 1736-1737
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Breaking Friedel’s Law in Polar Two Dimensional Materials
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- 04 August 2017, pp. 1738-1739
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Characterizing Multi-layer Pristine Graphene, Its Contaminants, and Their Origin Using Transmission Electron Microscopy
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- 04 August 2017, pp. 1740-1741
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SEM and TEM Study of a Ceramic Membrane/Laser Induced Graphene Composite
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- 04 August 2017, pp. 1742-1743
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Electron Diffraction of Germanane
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- 04 August 2017, pp. 1744-1745
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Growth Dynamics, Stacking Sequence and Interlayer Coupling in Few-Layer Graphene Revealed by in Situ SEM
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- 04 August 2017, pp. 1746-1747
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RISE - Raman SEM Imaging of Single Layer and Twisted Bilayer Graphene
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- 04 August 2017, pp. 1748-1749
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Revealing the Bonding of Nitrogen Impurities in Monolayer Graphene
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- 04 August 2017, pp. 1750-1751
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Hidden Defects and Unexpected Properties of Graphene — How Advanced TEM Contributes to Materials Development
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- 04 August 2017, pp. 1752-1753
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Local Layer Stacking and Structural Disorder in Graphene Oxide Studied via Scanning Electron Diffraction.
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- 04 August 2017, pp. 1754-1755
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Visualizing the Spatial Distribution of Ripples in Graphene with Low-Energy Electron Diffractive Imaging
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- 04 August 2017, pp. 1756-1757
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Ambient Dependent Formation of Zn2SiO4 and SiO2 from Core-shell ZnO@SiO2
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- 04 August 2017, pp. 1758-1759
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Probing Two-dimensional (Bi,Sb)2Te3/h-BN Heterostructures Using Complementary S/TEM and Simulation Techniques
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- 04 August 2017, pp. 1760-1761
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Atomic study of Hybrid Spintronic Heterostructures: Co2FeAl05Si0.5/Ge(111)
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- 04 August 2017, pp. 1762-1763
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In Situ Heating Study of 2H-MoTe2 to Mo6Te6 Nanowire Phase Transition
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- 04 August 2017, pp. 1764-1765
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