Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-29T21:22:28.645Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Scale Structure and Defects in 2D GaSe Films and Van der Waals Interface

Published online by Cambridge University Press:  04 August 2017

Jared M Johnson ,
Choong Hee Lee ,
Sriram Krishnamoorthy ,
Siddharth Rajan  and
Jinwoo Hwang
Jared M Johnson
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43212
Choong Hee Lee
Affiliation:
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210
Sriram Krishnamoorthy
Affiliation:
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210
Siddharth Rajan
Affiliation:
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210
Jinwoo Hwang
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43212

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1728 - 1729
Copyright
© Microscopy Society of America 2017 

References

[1] Krishnamoorthy, S., et al., Appl. Phys. Lett. 109, 183505 2016.Google Scholar
[2] Lee, C. H., et al.(submitted).Google Scholar
[3] Zhou, Y., et al., ACS Nano 8, 1485 2014.Google Scholar