Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Imaging and Spectroscopy of Beam Sensitive Materials

Abstract

Direct Detection Image Detector and Electron Counting - A New Tool for High Resolution Imaging of Metal-organic Frameworks

Revealing the Structure of Graphitic Carbon Nitride through Low-Dose TEM using a Direct Electron Detector

Determining Optical Absorption Coefficients in Beam Sensitive Materials using Monochromated Electron Energy-Loss Spectroscopy

Damage by Induced Electric Field in Beam-sensitive Materials

Characterization of Fluorescence-tagged Polymeric Particles using Confocal Laser Scanning Microscopy and Three Dimensional Structured Illumination Microscopy

Polymer imaging in SEM—charge, damage and coating free

The Structure and Electronic States of Self-Assembled C60 Crystals

Investigation of the Nature of Capping Layer Materials for FIB-SEM Preparation: Implications for the Study of Carbonaceous Material in Extraterrestrial Samples

Characterization of BiVO4 Powders and Thin Films by Electron Microscopy and Electron Energy Loss Spectroscopy

Convenient Optics for High Dispersion Small Angle Electron Diffraction with Highly Coherent Low Dose Illumination

Transmission Electron Microscope Observation of Charge Distribution on Insulating Thin Films by Hydro-carbon Deposition

Accelerating Voltage and Probe Current Dependence of Electron Beam Drilling Rates for Silicon Crystal

Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons

Non-invasive Morphological and Elemental Analysis of Ivory Plate for Artworks Authentication Using ESEM and EDS

Microgel Swelling Studied by Cryo-SEM

Scientific Analysis of NPAR Processing of EBSD Results for Beam-Sensitive Materials

SEM/EDS Analysis of Cell Phone Cover Glass Facilitated by the Use of a Silicon Drift Detector

Treading Lightly - Achieving Spectroscopy and Elemental Maps of Beam Sensitive Specimens in the SEM

Damage-less Chemical State Analysis by Using Soft X-ray Emission Spectroscopy in Low Voltage SEM

Imaging Hydrated Nanostructured Zeolite X using Single-Electron-Detection Camera

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Imaging and Spectroscopy of Beam Sensitive Materials

Abstract