Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Advanced Microscopy and Microanalysis of Complex Oxides

Abstract

Understanding the Effect of Doping and Epitaxial Strain on the Ferroelectric Polarization of Layered Perovskite Thin Films

Transmission Electron Microscopy and First-Principles Study on Highly Strained BiFeO3 Grown on LaAlO3

STEM-EELS Investigation of Charge and Strain Distributions in Perovskite Oxide Thin Films

Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision

Atomic Mapping of Domain Configurations in Ferroelectric Thin Films

Correlating Local Chemistry and Local Cation Displacements in the Relaxor Ferroelectric PMN

Atomic-Scale Investigations of Domain Walls in Polycrystalline BiFeO3

Multimodal Chemical and Functional Imaging of Nanoscale Transformations in Ferroelectric Thin Films

In-situ Observation of Cu Filaments Evolution in SiO2 layer

Partial Ferroelastic Domain Mediated Ferroelectric Domain Switching

In-situ Transmission Electron Microscopy Study of Oxygen Vacancy Ordering and Dislocation Annihilation in Undoped and Sm-doped CeO2 Ceramics During Redox Processes

In-situ STEM-EELS observation of ferroelectric switching of BaTiO3 film on GaAs

Emergent Phase Coherence of Stripe Order in Manganites Revealed with Cryogenic Scanning Transmission Electron Microscopy

Intricate Physics of Coherent Electron Beam/Oxide Materials Interaction Revealed by 4D Inline Holography—Electron Ptychography

Measuring Orbital Angular Momentum (OAM) and Torque Transfer from Polarization Vortices with the Electron Microscopy Pixel Array Detector

Measuring Ferroelectric Order Parameters at Domain Walls and Vortices in Hexagonal Manganites with Atomic Resolution STEM

Quantifying Local Structure of Complex Oxides Using Accurate and Precise Scanning Transmission Electron Microscopy

Nanoscale Compositional Analysis of a Thermally Processed Entropy-Stabilized Oxide via Correlative TEM and APT

Correlative Raman Spectroscopy and Focused Ion Beam for Targeted Microstructural Analysis of Titania Polymorphs

Solid State Transition from γ to α-Al2O3 Induced by SPEX Mechanical Milling

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Physical Science Symposia

Advanced Microscopy and Microanalysis of Complex Oxides

Abstract