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Revealing the Bonding of Nitrogen Impurities in Monolayer Graphene

Published online by Cambridge University Press:  04 August 2017

Juan Carlos Idrobo
Affiliation:
Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, USA
Cong Su
Affiliation:
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Cambridge, USA Research Laboratory of Electronics (RLE), Massachusetts Institute of Technology, Cambridge, USA
Ju Li
Affiliation:
Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Cambridge, USA Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, USA
Jing Kong
Affiliation:
Research Laboratory of Electronics (RLE), Massachusetts Institute of Technology, Cambridge, USA Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Meyer, J., et al, Nature Materials 10 2011). p. 209215.CrossRefGoogle Scholar
[2] Zhao, L., et al, Science 333 2011). p. 9991003.Google Scholar
[3] Nicholls, R.J., et al, ACSNano 7 2013). p. 71457150.Google Scholar
[4] Zhou, W., et al, Physical Review Letters 109 2012). p. 206803.Google Scholar
[5] Ramasse, Q. M., et al, Nano Letters 10 2013). p. 49894995.Google Scholar
[6] Krivanek, O. L., et al., Ultramicroscopy 108 2008). p. 179195.Google Scholar
[7] Research supported by Oak Ridge National Laboratory's Center for Nanophase Materials Sciences, which is a U.S. Department of Energy Office of Science User Facility. We also acknowledge support by the Center for Excitonics, an Energy Frontier Research Center funded by the US Department of Energy, Office of Science, Basic Energy Sciences under award no. DE-SC0001088.Google Scholar