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Electron-Beam-Induced Deposition of Carbon Nanorod via Spot Mode as Highly Stable and Sensitive AFM Probe Tip

Published online by Cambridge University Press:  04 August 2017

Wen Qian ,
Charles Nguyen ,
Joseph A. Turner  and
Dalie Liu
Wen Qian
Affiliation:
Dept of Mechanical & Materials, University of Nebraska-Lincoln, Lincoln, NE
Charles Nguyen
Affiliation:
Dept of Mechanical & Materials, University of Nebraska-Lincoln, Lincoln, NE
Joseph A. Turner
Affiliation:
Dept of Mechanical & Materials, University of Nebraska-Lincoln, Lincoln, NE
Dalie Liu
Affiliation:
Dept of Mechanical Engineering, Zhejiang A & F University, Lin’an, Hangzhou, China

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1736 - 1737
Copyright
© Microscopy Society of America 2017 

References

[1] Wilson, N., et al, Nature Nanotechnology 4 2009). p. 483.CrossRefGoogle Scholar
[2] Cheung, C., et al, PNAS 97 2000). p. 3809.CrossRefGoogle Scholar
[3] Zenhausern, F., et al, Journal of Applied Physics 73 1993). p. 7232.Google Scholar
[4] This research was supported in part by the funds from the Nebraska Research Initiative.Google Scholar