Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-26T11:54:12.259Z Has data issue: false hasContentIssue false
  • English
  • Français

Probing Two-dimensional (Bi,Sb)2Te3/h-BN Heterostructures Using Complementary S/TEM and Simulation Techniques

Published online by Cambridge University Press:  04 August 2017

Danielle Reifsnyder Hickey ,
Joon Sue Lee ,
Ryan J. Wu ,
Nitin Samarth  and
K. Andre Mkhoyan
Danielle Reifsnyder Hickey
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
Joon Sue Lee
Affiliation:
Department of Physics, The Pennsylvania State University, University Park, PA 16802, United States
Ryan J. Wu
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
Nitin Samarth
Affiliation:
Department of Physics, The Pennsylvania State University, University Park, PA 16802, United States
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1760 - 1761
Copyright
© Microscopy Society of America 2017 

References

[1] Mellnik, AR, et al, Nature 511 2014). p. 449.Google Scholar
[2] Li, CH, et al, Nat. Nanotech 9 2014). p. 218.Google Scholar
[3] Lee, JS, et al, Phys. Rev. B 92 2015 155312.Google Scholar
[4] Jamali, M, et al, Nano Lett. 15 2015). p. 7126.Google Scholar
[5] Kirkland, EJ Advanced Computing in Electron Microscopy, 2nd ed. New York 2010.Google Scholar
[6] The authors gratefully acknowledge funding provided by C-SPIN, one of six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA.Google Scholar