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Hidden Defects and Unexpected Properties of Graphene — How Advanced TEM Contributes to Materials Development

Published online by Cambridge University Press:  04 August 2017

Benjamin Butz ,
Christian Dolle ,
Florian Niekiel ,
Erdmann Spiecker ,
Konstantin Weber ,
Bernd Meyer ,
Daniel Waldmann ,
Ferdinand Kisslinger ,
Heiko B. Weber  and
Sam Shallcross
...Show all authors
Benjamin Butz
Affiliation:
Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander-Universitat Erlangen-Nurnberg Erlangen, Germany Visiting Scholar, Materials Science & Engineering, Stanford University, Stanford, CA, United States
Christian Dolle
Affiliation:
Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander-Universitat Erlangen-Nurnberg Erlangen, Germany
Florian Niekiel
Affiliation:
Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander-Universitat Erlangen-Nurnberg Erlangen, Germany
Erdmann Spiecker
Affiliation:
Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Friedrich-Alexander-Universitat Erlangen-Nurnberg Erlangen, Germany
Konstantin Weber
Affiliation:
Interdisciplinary Center for Molecular Materials (ICMM) & Computer Chemistry Center (CCC), Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Bernd Meyer
Affiliation:
Interdisciplinary Center for Molecular Materials (ICMM) & Computer Chemistry Center (CCC), Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Daniel Waldmann
Affiliation:
Chair for Applied Physics, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Ferdinand Kisslinger
Affiliation:
Chair for Applied Physics, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Heiko B. Weber
Affiliation:
Chair for Applied Physics, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Sam Shallcross
Affiliation:
Lehrstuhl fur Theoretische Festkorperphysik, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Christian Halbig
Affiliation:
Department of Chemistry and Pharmacy and Central Institute of Materials and Processes (ZMP), Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Siegfried Eigler
Affiliation:
Department of Chemistry and Pharmacy and Central Institute of Materials and Processes (ZMP), Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany Institut fur Chemie und Biochemie, Organische Chemie, Freie Universitat Berlin, Erlangen, Germany
Colin Ophus
Affiliation:
Molecular Foundry/National Center for Electron Microscopy, Lawrence Berkeley National, Laboratory, Berkeley, CA, United States

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1752 - 1753
Copyright
© Microscopy Society of America 2017 

References

[1] Butz, B, et al, Angew. Chem. Int. Edit 55 2016). pp. 15771.CrossRefGoogle Scholar
[2] Butz, B, et al, Nature 505 2014). pp. 533.CrossRefGoogle Scholar
[3] Kisslinger, F, et al, Nat. Phys. 11 2015). pp. 650.CrossRefGoogle Scholar
[4] Waldmann, D, et al, ACS Nano 7 2013). pp. 4441.CrossRefGoogle Scholar
[5] The authors acknowledge financial support by the German Research Foundation (DFG) within the frameworks of the SFB953 Synthetic Carbon Allotropes, grants no. BU 2875/2-1 and no. EI 938/3-1, and the Erlangen Cluster of Excellence 315 Engineering of Advanced Materials.Google Scholar