Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

Automated SEM Analysis in Industrial Process Control and Scientific Research

Using Nion Swift for Data Collection, Analysis and Display

Enabling Future Nanotomography and Nanofabrication with Crossbeam Technology

AFM Integrated with SEM/FIB for Complete 3D Metrology Measurements

Image Collection using an Auto Data Acquisition System and An Application to Ice embedded Ribosome

A New Microstructural Imaging Approach through EBSD Pattern Region of Interest Analysis

Concepts for an Annular Pole Piece Detector for the Simultaneous Measurement of X-Rays and Backscattered Electrons Inside a SEM

Performance Advances in LEAP systems

The pnCCD for Applications in Transmission Electron Microscopy: Further Development and New Operation Modes

Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM

Are EDS Specifications Still Relevant

Introduction of a New Conventional SEM: JSM-IT300LV:The Observation of a Water Containing Specimen With a Cooling Stage at 650 Pa

Advancements in Decontamination of Vacuum Systems Using Plasma Cleaning

Measurement of Downstream Charge Transport During Plasma Cleaning of Vacuum Chambers

New X-ray Transparent and Light Tight Windows for EDS Detectors

Geochemical Evaluation of Geopressued Geothermal Wellbore Cement

Atomic Resolution Characterization of Ni base Nanoparticles for Energy Devices.

Functionalized Surfaces to Improve Imaging Conditions in Liquid Cell Transmission Electron Microscopy

A New In-situ Broad Ion Beam, With Energy Range 1 – 500 eV

On the Characterization of the Geometrical Collection Efficiency of Modern EDS Systems

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract