Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract

X-ray Microscopy: The Cornerstone for Correlative Characterization Methods in Materials Research and Life Science

Multi-Scale Characterization of Different Generations of Gamma Prime Precipitates in Nickel-based Superalloys Using Correlative Microscopy Techniques

FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy

Hybrid SEM/AFM System from Carl Zeiss Revolutionizes Analysis of Functional Micro- and Nanostructured Specimen

Correlative Compositional Analysis of Fiber-Optic Nanoparticles

Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)

Understanding Fayalite Chemistry using Electron Microscopy and Atom Probe Tomography

Beware of Artifacts When Characterizing Nanometer Device Features Smaller than a TEM Lamella Thickness in Semiconductor Wafer-foundries

Comprehensive Nanofabrication by Correlating Crossbeam and ORION Nanofab

A Streamlined Technique to Examine Cell Monolayers by means of Correlative Light and Transmission Electron Microscopy

The SECOM Platform: an Integrated CLEM Solution

Combining Terapixel-Scale SEM Imaging and High-Resolution TEM Studies for Mineral Exploration.

Correlative Light and Electron Microscopy - on the Way from 2D Towards 3D

New Preparation Method using Ionic Liquid for Fast and Reliable SEM Observation of Biological Specimens

Investigation of Friction Wear Process in the Presence of Exfoliated Graphite Nanoparticles using Correlative in situ Raman Micro Spectrometry and Post Mortem Raman, Analytical Scanning and Transmission Electron Microscopies

Ionic Liquid Preparation for SEM Observation of Minute Crustacean

Development of High Pressure Freezing and Correlative Light/Electron Microscopy for Drosophila Larvae

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract

Imaging Extended Defects by TEM

Towards a Uniform Model for Lattice Defect Image Simulations

Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract