Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-26T16:35:51.637Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Resolution Characterization of Ni base Nanoparticles for Energy Devices.

Published online by Cambridge University Press:  27 August 2014

H. A. Calderon ,
F. Godinez-Salomon ,
O. Solorza-Feria ,
P. Specht  and
C. Kisielowski
H. A. Calderon
Affiliation:
Dept. Física, ESFM-IPN, Zacatenco D.F. 07338, Mexico
F. Godinez-Salomon
Affiliation:
Dept. Química, CINVESTAV, Mexico D.F.Mexico
O. Solorza-Feria
Affiliation:
Dept. Química, CINVESTAV, Mexico D.F.Mexico
P. Specht
Affiliation:
JCAP and NCEM, LBNL, Berkeley, CA 94720, U.S.A.
C. Kisielowski
Affiliation:
Dept. Mats. Sci. Eng., UCB, Berkeley, CA 94720

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1138 - 1139
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Godinez Salomon, F., et al., ongoing research.Google Scholar
[2] Calderon, H. A., et al, publication in preparation.Google Scholar
[3] HACB and OSE whish to acknowledge support from CONACYT and IPN.Google Scholar