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Using Nion Swift for Data Collection, Analysis and Display

Published online by Cambridge University Press:  27 August 2014

C.E. Meyer ,
N. Dellby ,
Z. Dellby ,
T.C. Lovejoy ,
M.C. Sarahan ,
G.S. Skone  and
O.L. Krivanek
C.E. Meyer
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA 98033, USA
N. Dellby
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA 98033, USA
Z. Dellby
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA 98033, USA
T.C. Lovejoy
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA 98033, USA
M.C. Sarahan
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA 98033, USA
G.S. Skone
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA 98033, USA
O.L. Krivanek
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA 98033, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1108 - 1109
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] http://www.python.org/.Google Scholar
[2] http://www.numpy.org/ and http://www.scipy.org/.Google Scholar
[3] Krivanek, O.L., et al., Ultramicroscopy 110 (2010) 935-945.Google Scholar
[4] http://nion.com/swift/.Google Scholar
[5] We are grateful to Prof. P.E. Batson for the use of the Nion UltraSTEM HERMES at Rutgers U.Google Scholar