Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Practical Applications and Analytical Trends of Metallography and Microstructure

Abstract

Use of the Distance Transform for the Integration of Local Measurements: Principle and Application in the Field of Chemical Engineering

Determination on the Structure of Au Nanorods with Pentagonal Cross-Sections by Various TEM Techniques

A Characterization Study of Initial γ' Phase Formation Produced by Microwave

A Novel Method for Microstructural Characterization of Cast Iron

A Method for Quantitative Analysis of Carbide Network Path Lengths in Ultrahigh Carbon Steel

Precession Electron Diffraction Detection and Phase Mapping of Retained Austenite and Carbides in a Heat Treated Low Alloy Carbon Steel Using a JEOL ARM 200 TEM with an AppFive Topspin System for Synchronized Beam Scanning and Precession

Dynamic Analysis of Nanomachining with a Multi- Cracked AFM Cantilever

A Transmission Electron Microscopy Study on Self-Catalyzed GaAs Nanostructures

Equiatomic NiCoAlFeMoTiCrx (x= 0,1) High Entropy Alloys Produced by Mechanical Alloying

Study of Au/Pd and Au/Co Bimetallic Nanoparticles Using Aberration Corrected STEM

Study of Coarsening in γ' Precipitates by Diffusion Couples

Influence of Cooling Rate on Corrosion Resistance of the A383 Aluminum to Biofuels E10, E30 and E100

Phase Identification by EBSD Analysis of Non-Metallic Crystallites

Analysis of Titanium Microalloying in As-Received and Oxidized Crofer® 22 APU

Effect of a Coating Induced Residual Stress on Magnetic Domain Structure in Non-Oriented Electrical Steels

Advances in Cathodoluminescence and Soft X-ray Microanalysis

Abstract

Valence Electron States of Carbon Materials studied by TEM-SXES

Development of Soft X-ray Microanalysis using Windowless SDD Technology

Using Accurate Solid Angle Tools when Comparing EDS Detector Geometries

Mapping of Weak Cathodoluminescence Signals

Cathodoluminescence Spectra Acquisition Using an Imaging Spectrograph and CCD Detector: Materials Characterization Using Trivalent REE Doped Synthetic and Natural Materials

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Practical Applications and Analytical Trends of Metallography and Microstructure

Abstract

Advances in Cathodoluminescence and Soft X-ray Microanalysis

Abstract