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Towards a Uniform Model for Lattice Defect Image Simulations

Published online by Cambridge University Press:  27 August 2014

M. De Graef
M. De Graef*
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1022 - 1023
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Phillips, PJ, Mills, MJ, and De Graef, M, Phil. Mag. 91 (2011) p. 2081.Google Scholar
[2] Picard, YN et al, Microscopy Today 20 (2012) p. 12.Google Scholar
[3] Research supported the Air Force Office of Scientific Research, MURI contract # FA9550-12-1-0458.Google Scholar