Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

3D Imaging and Microanalysis: Image Analysis and Applications

Abstract

RGB Analysis of Wedge Angles Around a Perforation in Silicon

Image Restoration via Phase-Derived Drift Correction of Movies of 2D Crystals Acquired with a CMOS Direct Electron Detector

Use of the Gabor Filter for Edge Detection in the Analysis of Zinc Oxide Nanowire Images

EMAN2.1 - A New Generation of Software for Validated Single Particle Analysis and Single Particle Tomography

Practical Applications and Analytical Trends of Metallography and Microstructure

Abstract

Opening the Door to Fundamental Understanding of Structure and Color Metallography - a Correlative Microscopy Study on Steel

Design of Novel Graded Microstructures for Cutting Tools Assisted by High Resolution Microscopy and Thermodynamic Modeling

Correlative Tomography - Extraction of Reliable Information with Adequate Resolution from mm Scale Down to Sub-nm Scale

Measurement of Decarburization of Heat Treated Steel Surfaces

Metallographic Techniques for Revealing the Microstructure of the Expanded Austenite Case on Surface-Hardened Corrosion-Resistant Alloys

Microstructural Evolution of SS304 upon Various Shot Peening Treatments

4D Characterization of Deformation Processes in Aluminum Foams: New Dimensions in Materials Engineering

Microstructure of the Muonionalusta Octahedrite Meteorite

Confirming the Composition of Shape Memory Alloys by Microstructural Characterization

EBSD Analysis for Microstructure Characterization of Zr-based Bulk Metallic Glass Composites

Thickness-Dependent Beam Broadening in Transmission EBSD

Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements

Exploitation of Contrasts in Low Energy SEM to Reveal True Microstructure

Characterization of the Surface Layer of Ag/W Electrical Contacts

Automated Quantitative Materials Microscopy

Nanoscale Crystallographic Analysis in FE-SEM Using Transmission Kikuchi Diffraction

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

3D Imaging and Microanalysis: Image Analysis and Applications

Abstract

Practical Applications and Analytical Trends of Metallography and Microstructure

Abstract