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RGB Analysis of Wedge Angles Around a Perforation in Silicon

Published online by Cambridge University Press:  27 August 2014

Jamie Daugherty  and
P. Fraundorf
Jamie Daugherty
Affiliation:
University of Missouri- Saint Louis, Department of Physics, Saint Louis MO, USA
P. Fraundorf
Affiliation:
University of Missouri- StL, Center for NanoScience & Dept. of Physics, Saint Louis MO, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 826 - 827
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] McCaffrey, J.P, Sullivan, B.T, Frase, J.W, Callahan, D.L (1996) Use of transmitted color to calibrate the thickness of silicon samples. Micron, 27, 407-411.Google Scholar
[2] Hirsch, P, Howie, A, Nicolson, R, Pashley, D.W, Whelan, M.j (1965/1977) Electron microscopy of thin crystals (Butterworths/Krieger, London/Malabar FL) ISBN 0-88275-376-2.Google Scholar
[3] The authors acknowledge funding from the Missouri Space Grant Consortium. David Osborn, Ashlynn Conner, and Stephen Ordway are thanked for their assistance, and Stephen Ordway is thanked for his thickness fringe data on the 2nd specimen.Google Scholar