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Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements

Published online by Cambridge University Press:  27 August 2014

Matthew M. Nowell ,
Stuart I. Wright ,
Travis Rampton  and
René de Kloe
Matthew M. Nowell
Affiliation:
EDAX Inc., Draper UT USA
Stuart I. Wright
Affiliation:
EDAX Inc., Draper UT USA
Travis Rampton
Affiliation:
EDAX Inc., Mahwah NJ USA
René de Kloe
Affiliation:
EDAX B.V., Tilburg The Netherlands

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 856 - 857
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Wright, S.I. and Nowell, M.M. Microscopy and Microanalysis 12 (2006), pp. 72-84.Google Scholar
[2] Day, A.P.and Quested, T.E Journal of Microscopy 195 (1999), pp. 186-196.Google Scholar