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Correlative Tomography - Extraction of Reliable Information with Adequate Resolution from mm Scale Down to Sub-nm Scale

Published online by Cambridge University Press:  27 August 2014

Frank Mücklich ,
Johannes Webel ,
Hisham Aboulfadl ,
N. Lindow  and
H.-C. Hege
Frank Mücklich
Affiliation:
Department Materials Science and Engineering, Saarland University, Saarbrücken, Germany Material Engineering Center Saarland (MECS), Steinbeis Research Center, Saarbrücken, Germany
Johannes Webel
Affiliation:
Department Materials Science and Engineering, Saarland University, Saarbrücken, Germany
Hisham Aboulfadl
Affiliation:
Department Materials Science and Engineering, Saarland University, Saarbrücken, Germany
N. Lindow
Affiliation:
Department of visualization and data analyses, Zuse Institute Berlin, Berlin, Germany
H.-C. Hege
Affiliation:
Department of visualization and data analyses, Zuse Institute Berlin, Berlin, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 838 - 839
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Ohser, J and Mücklich, F Statistical Analysis of Microstructures in Materials Science, John Wiley & Sons, Chichester (2000).Google Scholar
[2] Arslan, L., et al, Ultramicroscopy 108 (2008) 1579-1585.Google Scholar
[3] Webel, J Development of a Light Microscopy Serial Sectioning Tomography (in German), Bachelor Thesis, Saarland University (2014).Google Scholar
[4] Lindow, N., Baum, D., Hege, H.-C. Eurographics Conference on Visualization 31 (2012) 1325-1334 [5] The authors acknowledge the funding from the German science foundation, MU 959/29.Google Scholar