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Thickness-Dependent Beam Broadening in Transmission EBSD

Published online by Cambridge University Press:  27 August 2014

Katherine P. Rice  and
Robert R. Keller
Katherine P. Rice
Affiliation:
Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, USA
Robert R. Keller
Affiliation:
Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 854 - 855
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Keller, RR, Geiss, RH Transmission EBSD from 10 nm domains in a scanning electron microscope. Journal of Microscopy (2012, 245 (3), 245-251.Google Scholar
[2] Brodusch, N., Demers, H., Gauvin, R. Nanometres-resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope. Journal of Microscopy (2013, 250 (1), 1-14.Google Scholar
[3] Trimby, P. W. Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope. Ultramicroscopy (2012, 120 (0), 16-24.Google Scholar