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Volume 17 - Supplement S2 - July 2011

Contents

Page 33 of 49

Physical Sciences

A.V. Crewe Memorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond

Abstract

  • Challenges in Imaging Single Atoms Adsorbed or Embedded on Surfaces

  • J Liu, L Allard
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1282-1283
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy

  • J Rouvière, H Okuno, P Jouneau, P Bayle-Guillemaud, B Daudin
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1284-1285
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Use of Aberration-Corrected STEM for Direct Structure and Chemistry Analysis of Catalytic Metal Particles

  • W Sinkler, S Bradley, L Allard, P Voyles
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1286-1287
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Nanoparticle Movement: Plasmonic Forces and Physical Constraints

  • P Batson, A Reyes-Coronado, R Barrera, A Rivacoba, P Echenique, J Aizpurua
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1288-1289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Improving the Spatial and Energy Resolution of Aberration-Corrected STEM

  • O Krivanek, N Dellby, M Murfitt, N Bacon, G Corbin, P Hrncirik, J Nelson, T Lovejoy, G Skone, Z Szilagyi
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1290-1291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Advances in STEM-CELL. A Free Software for TEM and STEM Analysis and Simulations: Probe Deconvolution in STEM-HAADF

  • V Grillo
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1292-1293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Quantitative Annular Dark Field Images of Silicon (001) Crystal

  • Y Oshima, S Kim, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1294-1295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Vortex Beams for Atomic Resolution Dichroism

  • J Idrobo, S Pennycook
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1296-1297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Channeling Contrast in Sub-Ångström Resolution High-Angle Annular Dark-Field Images of Planar Interfaces

  • J Liu, L Allard
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1300-1301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Usual and Unusual Effects in ADF-STEM Imaging of Dopant Atom in Crystals

  • A Mittal, A Gunawan, K Mkhoyan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1302-1303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atomic Resolution Defect Analysis Using Low Angle ADF-STEM

  • P Phillips, L Kovarik, M Mills
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1304-1305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Novel Multivariate Statistical Analysis Methods for STEM/EELS

  • M Sarahan, F de la Peña, Q Ramasse, M Walls
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1306-1307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Auto-Tuning of Aberrations Using High-Resolution STEM Images by Auto-Correlation Function

  • H Sawada, M Watanabe, E Okunishi, Y Kondo
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1308-1309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Exploring the Strain Sensitivity of Image Contrast in Quantitative STEM of SrTiO3

  • J Zhang, J LeBeau, A D'Alfonso, L Allen, S Stemmer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1310-1311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries

Abstract

  • Some Historical Comments about Interface Research

  • M Rühle
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1312-1313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Picometer Transmission Electron Microscopy

  • K Urban
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1314-1315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Low kV Analysis and First Principles Study of the Structure and Bonding at SrTiO3/GaAs Hetero-Interfaces

  • Q Qiao, R Klie, S Ogut
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1318-1319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures

  • N Gauquelin, M Couillard, H Zhang, J Wei, G Botton
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1320-1321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 33 of 49