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Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  08 April 2017

H Inada ,
K Tamura ,
K Nakamura ,
Y Suzuki ,
M Konno ,
D Su ,
J Wall ,
R Egerton  and
Y Zhu
H Inada
Affiliation:
Hitachi High Technologies
K Tamura
Affiliation:
Hitachi High Technologies
K Nakamura
Affiliation:
Hitachi High Technologies
Y Suzuki
Affiliation:
Hitachi High Technologies
M Konno
Affiliation:
Hitachi High Technologies
D Su
Affiliation:
Brookhaven National Laboratory
J Wall
Affiliation:
Brookhaven National Laboratory
R Egerton
Affiliation:
University of Alberta, Canada
Y Zhu
Affiliation:
Brookhaven National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1298 - 1299
Copyright
Copyright © Microscopy Society of America 2011