Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

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Volume 17 - Supplement S2 - July 2011

Contents

Page 30 of 49

Instrumentation and Techniques

Tools for Science

Abstract

Performance and Application of an Aberration Corrected Analytical Electron Microscope with a Cold Field Emission Gun
Y Kohno, E Okunishi, I Ishikawa, T Tomita, T Kaneyama, Y Kondo
Published online by Cambridge University Press:

08 April 2017, pp. 1162-1163
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

STEM-based Technologies for Nano and Biological Sciences
X Zhang
Published online by Cambridge University Press:

08 April 2017, pp. 1164-1165
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

In Situ Material Removal over Many Orders of Magnitude
M Straw, D Phifer
Published online by Cambridge University Press:

09 April 2017, pp. 1166-1167
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advances in EELS Instrumentation: A New Design High-Vacuum Parallel EELS System
R Twesten, C Trevor, M Barfels, Y Sato, N Menon, P Thomas, A Gubbens
Published online by Cambridge University Press:

08 April 2017, pp. 1168-1169
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Recent Developments in Silicon Drift Detector Technology: Atomic to mm Scale
M Falke, S Scheller, A Kaeppel, R Terborg, R Kröemer, D Fißler, M Rohde
Published online by Cambridge University Press:

08 April 2017, pp. 1170-1171
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

3 Dimensional Microscopy, Large Volume Serial Block Face Imaging in the SEM
J Mancuso
Published online by Cambridge University Press:

08 April 2017, pp. 1172-1173
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Reducing Reagent Consumption and Improving Efficiency of Specimen Fixation and Embedding, Grid Staining and Archiving using mPrep™ Capsule Processing
S Goodman, M Kostrna
Published online by Cambridge University Press:

09 April 2017, pp. 1174-1175
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A to Z of Technology - Software for Better Results with Faster Sensors
S Burgess, J Goulden, A Hyde, D Redfern, N Rowlands
Published online by Cambridge University Press:

08 April 2017, pp. 1176-1177
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Retrofittable Nano-Manipulation Systems for Scanning Electron Microscope
P Woo, M Nakamura, D Hoyle, I Cotton, Y Zhang, B Chen, Y Zhang, Y Sun
Published online by Cambridge University Press:

09 April 2017, pp. 1178-1179
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Is “There an App for That?” Take a Look at the New Portable Scanning Electron Microscopes
D Guarrera, A Abe, T Miyahara, Y Ohta
Published online by Cambridge University Press:

08 April 2017, pp. 1180-1181
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

The How and Why of Smart Features
R Anderhalt, T Nylese
Published online by Cambridge University Press:

09 April 2017, pp. 1182-1183
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Development of 30-kV Cc/Cs Correction Tandem System
H Sawada, F Hosokawa, T Sasaki, S Yuasa, M Kawazoe, M Terao, T Kaneyama, Y Kondo, K Kimoto, K Suenaga
Published online by Cambridge University Press:

08 April 2017, pp. 1184-1185
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Results on 20kV Spectroscopy with Monochromation and In-Column Filter
S Pokrant, A Orchowski, G Benner, M Cheynet, U Kaiser
Published online by Cambridge University Press:

08 April 2017, pp. 1186-1187
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Image Restoration by DOG Multi-Scale Analysis
K Honda, K Kawauchi, T Nokuo, N Kikuchi, N Erdman
Published online by Cambridge University Press:

08 April 2017, pp. 1188-1189
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Trials to Improve Image Quality in Electron Tomography
T Hashimoto, T Kubo, T Yotsuji, T Oyagi, M Kawasaki, E Nakazawwa, A Wakui, T Tanaka, H Kobayashi
Published online by Cambridge University Press:

08 April 2017, pp. 1190-1191
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes
F Eggert, T Elam, R Anderhalt, J Nicolosi
Published online by Cambridge University Press:

08 April 2017, pp. 1192-1193
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

High Quality Cross Sections of Low Melting Point Samples Prepared with Cryo Ion Slicer - Broad Ar Ion Beam Milling Apparatus with a Newly Developed Specimen Cooling Unit
Y Nakajima, M Shibata, H Matsushima, T Suzuki, N Erdman
Published online by Cambridge University Press:

08 April 2017, pp. 1194-1195
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

3D Confocal Raman Imaging of Transparent and Opaque Samples
U Schmidt, J Yang, W Liu, A Jauss, T Dieing
Published online by Cambridge University Press:

08 April 2017, pp. 1196-1197
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

A New Electron Microscope with an Easy Operation System for Nano Analysis
S Kawai, M Matsushita, K Tanaka, T Iwama, N Endo, T Kuba, Y Ohkura, Y Kondo
Published online by Cambridge University Press:

09 April 2017, pp. 1198-1199
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below
M Falke, A Kaeppel, R Terborg
Published online by Cambridge University Press:

09 April 2017, pp. 1200-1201
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 30 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Tools for Science

Abstract

Performance and Application of an Aberration Corrected Analytical Electron Microscope with a Cold Field Emission Gun

STEM-based Technologies for Nano and Biological Sciences

In Situ Material Removal over Many Orders of Magnitude

Advances in EELS Instrumentation: A New Design High-Vacuum Parallel EELS System

Recent Developments in Silicon Drift Detector Technology: Atomic to mm Scale

3 Dimensional Microscopy, Large Volume Serial Block Face Imaging in the SEM

Reducing Reagent Consumption and Improving Efficiency of Specimen Fixation and Embedding, Grid Staining and Archiving using mPrep™ Capsule Processing

A to Z of Technology - Software for Better Results with Faster Sensors

Retrofittable Nano-Manipulation Systems for Scanning Electron Microscope

Is “There an App for That?” Take a Look at the New Portable Scanning Electron Microscopes

The How and Why of Smart Features

Development of 30-kV Cc/Cs Correction Tandem System

Results on 20kV Spectroscopy with Monochromation and In-Column Filter

Image Restoration by DOG Multi-Scale Analysis

Trials to Improve Image Quality in Electron Tomography

Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes

High Quality Cross Sections of Low Melting Point Samples Prepared with Cryo Ion Slicer - Broad Ar Ion Beam Milling Apparatus with a Newly Developed Specimen Cooling Unit

3D Confocal Raman Imaging of Transparent and Opaque Samples

A New Electron Microscope with an Easy Operation System for Nano Analysis

Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Instrumentation and Techniques

Tools for Science

Abstract