Microscopy and Microanalysis: Volume 17 - Issue S2

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Microscopy and Microanalysis
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Volume 17 - Supplement S2 - July 2011

Contents

Page 32 of 49

Physical Sciences

A.V. Crewe Memorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond

Abstract

Single Atom Imaging and EELS; 40 Years Ago
M Isaacson
Published online by Cambridge University Press:

08 April 2017, pp. 1242-1243
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Chicago Exploration Days
E Zeitler
Published online by Cambridge University Press:

08 April 2017, pp. 1244-1245
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Chicago Aberration Correction Work
V Beck
Published online by Cambridge University Press:

08 April 2017, pp. 1246-1247
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Interfacial Atomic Structure and Chemistry at Ceria Grain Boundaries
J Aguiar, H Yang, M Sarahan, N Browning
Published online by Cambridge University Press:

08 April 2017, pp. 1248-1249
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Single-atom Sensitive Chemical and Structural STEM Characterization of Two-Dimentional MoS2 Nano-catalysts
Q Ramasse, L Hansen, M Brorson, E Johnson, B Schaffer, C Kisielowski, S Helveg
Published online by Cambridge University Press:

08 April 2017, pp. 1250-1251
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Seeing the Atoms more Clearly: STEM Imaging from the Crewe Era to Today
S Pennycook
Published online by Cambridge University Press:

08 April 2017, pp. 1252-1253
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Efficient Elastic Imaging of Single Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy
R Hovden, D Muller
Published online by Cambridge University Press:

08 April 2017, pp. 1254-1255
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Atomic-Resolution Differential Phase Contrast Imaging by STEM
N Shibata, S Findlay, Y Ikuhara
Published online by Cambridge University Press:

08 April 2017, pp. 1256-1257
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)
N Alem, Q Ramasse, M Sarahan, R Erni, O Yazyev, K Erickson, S Louie, A Zettl
Published online by Cambridge University Press:

08 April 2017, pp. 1258-1259
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials
M Chisholm, G Duscher, W Windl
Published online by Cambridge University Press:

09 April 2017, pp. 1260-1261
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Quantitative Composition Measurements of Atomic Columns Using STEM; Application to L12 Precipitates
C Ophus, A Gautam, E Marquis, U Dahmen, V Radmilovic
Published online by Cambridge University Press:

09 April 2017, pp. 1262-1263
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

CCEREM: Critical-Convergence Extended-Resolution Electron Microscopy
M O'Keefe, L Allard, D Blom
Published online by Cambridge University Press:

08 April 2017, pp. 1264-1265
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Atomic Resolution at 50 - 300 kV Obtained using Low Dose Rate HRTEM
B Barton, C Song, C Kisielowski
Published online by Cambridge University Press:

08 April 2017, pp. 1266-1267
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Observation of Defects of CuInSe2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope
T Tanaka, A Takeshita, T Kubota, Y Oshima, Y Tanishiro, K Takayanagi
Published online by Cambridge University Press:

08 April 2017, pp. 1268-1269
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Realization of the First Aplanatic Transmission Electron Microscope
I Maβmann, S Uhlemann, H Müller, P Hartel, J Zach, M Haider, Y Taniguchi, D Hoyle, R Herring
Published online by Cambridge University Press:

08 April 2017, pp. 1270-1271
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

From Early Days of Cold Field-Emission Electron Gun at Hitachi to Sub-Angstrom Holography
A Tonomura
Published online by Cambridge University Press:

08 April 2017, pp. 1272-1273
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

DNA Sequencing by Electron Microscopy
A Bleloch, C Own, M Hamalainen, J Hershleb, K Kemmish, R Koene, H Stark, J Stark, M Andregg, W Andregg
Published online by Cambridge University Press:

08 April 2017, pp. 1274-1275
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Albert Crewe's Dream Realized: Sequencing DNA with STEM
D Bell, W Thomas, K Murtagh, W Glover
Published online by Cambridge University Press:

08 April 2017, pp. 1276-1277
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Direct Imaging of Hydrogen Atoms in a Crystal by Annular Bright-field STEM
E Abe, R Ishikawa, E Okunishi, H Sawada, Y Kondo, F Hosokawa
Published online by Cambridge University Press:

08 April 2017, pp. 1278-1279
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Is There a Stobbs Factor in Atomic-Resolution STEM-EELS Mapping?
H Xin, C Dwyer, D Muller
Published online by Cambridge University Press:

08 April 2017, pp. 1280-1281
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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 32 of 49

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Physical Sciences

A.V. Crewe Memorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond

Abstract

Single Atom Imaging and EELS; 40 Years Ago

Chicago Exploration Days

Chicago Aberration Correction Work

Interfacial Atomic Structure and Chemistry at Ceria Grain Boundaries

Single-atom Sensitive Chemical and Structural STEM Characterization of Two-Dimentional MoS2 Nano-catalysts

Seeing the Atoms more Clearly: STEM Imaging from the Crewe Era to Today

Efficient Elastic Imaging of Single Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy

Atomic-Resolution Differential Phase Contrast Imaging by STEM

Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)

Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials

Quantitative Composition Measurements of Atomic Columns Using STEM; Application to L12 Precipitates

CCEREM: Critical-Convergence Extended-Resolution Electron Microscopy

Atomic Resolution at 50 - 300 kV Obtained using Low Dose Rate HRTEM

Observation of Defects of CuInSe2 by 300 kV Aberration Corrected Scanning Transmission Electron Microscope

Realization of the First Aplanatic Transmission Electron Microscope

From Early Days of Cold Field-Emission Electron Gun at Hitachi to Sub-Angstrom Holography

DNA Sequencing by Electron Microscopy

Albert Crewe's Dream Realized: Sequencing DNA with STEM

Direct Imaging of Hydrogen Atoms in a Crystal by Annular Bright-field STEM

Is There a Stobbs Factor in Atomic-Resolution STEM-EELS Mapping?

Microscopy and Microanalysis

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Volume 17 - Supplement S2 - July 2011

Physical Sciences

A.V. Crewe Memorial Symposium: From Images of Single Atoms to Single Atom Spectroscopy and Beyond

Abstract