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Volume 17 - Supplement S2 - July 2011

Contents

Page 34 of 49

Physical Sciences

Structural and Physical properties of Thin Films, Interfaces, and Grain Boundaries

Abstract

  • Structure and Energy of Equilibrated Ni-Al2O3 Interfaces

  • H Meltzman, W Kaplan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1322-1323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Role of γ-Al2O3 Single Crystal Support to Pt Nanoparticles Construction

  • Z Zhang, L Li, L-L Wang, S Sanchez, Q Wang, D Johnson, A Frenkel, R Nuzzo, J Yang
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Interface and Structural Characterization of Buried CoSi2/Si(001) Nanoplatelets

  • L Montoro, A Isaac, L Giovanetti, F Requejo, A Ramirez
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Wetting-Dewetting Transitions of Ultrathin Nickel Films Deposited on Silicon (100) Substrates

  • A Thron, P Greene, K Liu, K van Benthem
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1328-1329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Formation of Single-Orientation Epitaxial Islands of TiSi2 on Si (001) using Sr Passivation

  • J Kim, A Posadas, R Dargis, M Choi, A Demkov, D Smith
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1330-1331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Order in Nanometer-Thick Intergranular Films at Au-Sapphire Interfaces

  • M Baram, S Garofalini, W Kaplan
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1332-1333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • ABF STEM Characterization of Light Elements in Ceramic Interface

  • Y Ikuhara, R Huang, S Findlay, T Mizoguchi, N Shibata, T Hirayama
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1334-1335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Grain Boundary Complexions in TiO2 Bicrystals Doped with CuO

  • S Ma, T Pennycook, M Oxley, D Leonard, C Kiely, S Pennycook, M Harmer
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1336-1337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Quantitative Study of an Incommensurate Grain Boundary Using Aberration Corrected Microscopy

  • A Gautam, T Radetic, F Lançon, U Dahmen
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1338-1339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • HRTEM Study of Dissociated Dislocation Structures in Low-Angle Grain Boundaries of Alumina

  • E Tochigi, N Shibata, A Nakamura, T Mizoguchi, T Yamamoto, Y Ikuhara
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1340-1341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Evolution of a Small Angle Boundary from a Perfect Lattice During Annealing of a Cross Rolled Aluminium Sample

  • M Shamsuzzoha
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1342-1343
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Line Defects at Interfaces in Telluride-Based Thermoelectric Materials

  • D Medlin, J Sugar, N Heinz, T Ikeda, G Snyder
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1344-1345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterizing Texture and Grain Boundaries in Nanoscale Cu Interconnects by Precession Electron Diffraction

  • K Ganesh, A Darbal, S Rajasekhara, G Rohrer, K Barmak, P Ferreira
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1346-1347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In situ TEM Investigation of electrical Current Effect on Aluminum Interconnect

  • D Xie, Z Shan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1348-1349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Characterization of Strontium Oxide Layers on Silicon for CMOS High-K Gate Stack Scaling

  • J Bruley, M Frank, C Marchiori, J Fompeyrine, V Narayanan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1350-1351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Evaluation of Defect Structures from In Situ Dielectric Breakdown of SiO2-Based Gate Dielectric Layers

  • C Bonifacio, K van Benthem
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1352-1353
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Microstructural Characterization of Closely-Lattice-Matched AlIn(Ga)N Alloys for High Electron Mobility Transistors

  • L Zhou, L Kirste, T Lim, R Aidam, O Ambacher, D Smith
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1354-1355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • 2-D Mapping of Ferroelectric Domains by Transmission Electron Microscopy

  • X Pan, C Nelson, Y Zhang, S Kim, B Winchester, L Chen, A Melville, C Adamo, D Schlom, C Folkman, S Baek, C Eom
  • Published online by Cambridge University Press:
    08 April 2017, pp. 1356-1357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • In-Situ Cross-Sectional Switching of Multiferroic BiFeO3 Thin Films

  • C Nelson, P Gao, J Jokisaari, B Winchester, Y Gu, C Heikes, A Melville, C Adamo, S Baek, C Folkman, C Eom, D Schlom, L Chen, X Pan
  • Published online by Cambridge University Press:
    09 April 2017, pp. 1360-1361
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 34 of 49