Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-17T03:22:21.839Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic Resolution Defect Analysis Using Low Angle ADF-STEM

Published online by Cambridge University Press:  09 April 2017

P Phillips ,
L Kovarik  and
M Mills
P Phillips
Affiliation:
Ohio State University
L Kovarik
Affiliation:
Pacific Northwest National Lab
M Mills
Affiliation:
Ohio State University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1304 - 1305
Copyright
Copyright © Microscopy Society of America 2011