Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

In-Situ EDS Characterization of TEM Lamellae Created by Xe Plasma FIB

Vacuum Assisted ex situ Lift Out of FIB Prepared Specimens

Focused Ne+ Ion Beams for Final Polishing of TEM Lamella Prepared Through Ga-FIB Systems

Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Nanoscale Probes in Ultrafast Transmission Electron Microscopy

Infrared Pump-Probe Spectroscopy of Plasmons in Graphene and Semiconductors

Ultrafast Plasmonic Forces Imposed by Fast Electrons on Metal Particles

Photonic Processes Visualized with Electrons in Photoemission Electron Microscopy (PEEM)

A06 Advanced Analytical TEM/STEM

Abstract

Global Analysis Peak Fitting Applied to EELS Images

Revisiting Noise Scaling for Multivariate Statistical Analysis

When will low-contrast features be visible in a STEM X-ray spectrum image?

Name that Atom in 60 Seconds or Less: Energy Dispersive X-Ray Spectroscopy of Individual Heteroatoms in Low Dimensional Materials

Single Atom Detection Through HAADF-STEM and EELS/EDX Characterization of Fluorophore Ru(bpy)32+ for Optical DNA-Chip Applications

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions

AFM Integrated with SEM/FIB for Complete 3D Metrology Measurements

Integrating Atomic Force Microscopy in Scanning Electron Microscopy

Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Quantification of Nano-inclusions by EPMA Using Conventional Accelerating Voltages

Multi-beam energy acquisition in FE-EPMA

Improvements in EPMA: Spatial Resolution and Analytical Accuracy

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract