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Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries

Published online by Cambridge University Press:  23 September 2015

Michael Presley
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Dan Huber
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH
Hamish Fraser
Affiliation:
Center for the Accelerated Maturation of Materials, The Ohio State University, Columbus OH

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

Reference:

[1] McCaffrey, J.P. & Phaneuf, M.W., Ultramicroscopy 87 (2001) 97104.Google Scholar
[2] Genc, A., Williams, R.E.A., Huber, D. & Fraser, H.L., Microsc Microanal 13 Suppl 2 (2007).Google Scholar
[3] Huang, Z., Journal of Microscopy 215(Pt 3 (2004) 219223.Google Scholar
[4] Kato, N., Journal of Electron Microscopy 53 (2004) 451458.Google Scholar