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When will low-contrast features be visible in a STEM X-ray spectrum image?

Published online by Cambridge University Press:  23 September 2015

Chad M. Parish
Chad M. Parish*
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1425 - 1426
Copyright
Copyright © Microscopy Society of America 2015 

References

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[7] Parish, C M & Microan., Mirosc., accepted.Google Scholar
[8] This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. A portion of the Microscopy conducted as part of a user proposal at ORNL's Center for Nanophase Materials Sciences, which is an Office of Science User Facility. I acknowledge the use of the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation.Google Scholar