Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

The Oxidation State of Nanophase Fe Particles Produced by Space Weathering as Revealed Through Aberration-Corrected Transmission Electron Microscopy

Aberration-Corrected STEM-EELS Measurements in Fe-bearing Silicate Glasses

Ti Valence States in Al,Ti-rich Pyroxenes from Comet Particles: Anchoring Ti ELNES Spectra with Vanadium Thin-films

Insights Into Regolith Evolution from TEM Studies of Space Weathering of Itokawa Particles

Novel Microtomy Methods For Small, Hard And Precious Extraterrestrial And Terrestrial Rocky Materials

P08 Microscopy and Characterization of Ceramics, Polymers and Composites

Abstract

Microscopy and Chemical Analysis of Topological Insulator Bi2Se3 and Topological Crystalline Insulator SnTe Nanostructures

Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO2 Structures using TEM and XPS

Hybrid Calcium Phosphate Neuron-Like Structures under the Microscope

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Exploring Lithium-ion Battery Performance through in situ Characterization

Dynamic Study of Sodiation Process in Single Crystalline a-MnO2 Nanowires

TEM Study of Heavily Twinned Cu3Pt Nanoparticles

The Role of Aberration-Corrected STEM in the Characterization of Oxide Cathode Materials

Challenges for ABF-STEM characterization of Li battery materials

P12 Advanced Microanalysis and Microscopy of Soft and Hybrid Nanomaterials

Abstract

Artefacts Induced on Soft Layer of Hybrid Metallic Nanoparticles in TEM

Serial block face SEM and TEM imaging for quantitative measurement of cellular uptake of semiconductor quantum dot nanoparticles

Thickness mapping of freestanding Ionic Liquid films using Electron Energy Loss Spectroscopy in the TEM

PSRT: Progressive Stochastic Reconstruction Technique for Cryo Electron Tomography

First Results of Integrating a Compression/Tension Load Cell with Nano-scale X-ray Transmission Microscopy

Non-local Prior Modeling for Tomographic Reconstruction of Bright Field Transmission Electron Microscopy Images

Technologist Forum, Tutorials and Outreach Symposia

X30 Technologists’ Forum: Emerging New Specialized Techniques for Correlative Microscopy

Abstract

A Modern Correlative Workflow Environment to Master the Multi-scale Challenge

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P03 Advances in Microanalysis of Earth and Planetary Materials

Abstract

P08 Microscopy and Characterization of Ceramics, Polymers and Composites

Abstract

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

P12 Advanced Microanalysis and Microscopy of Soft and Hybrid Nanomaterials

Abstract

Technologist Forum, Tutorials and Outreach Symposia

X30 Technologists’ Forum: Emerging New Specialized Techniques for Correlative Microscopy

Abstract