Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Improving Trace Element Analysis Precision By Not Using Off-Peak Measurements

Using EPMA, Raman LS, Hyperspectral CL, SIMS, and EBSD to Study Impact-Melt-Induced Decomposition of Zircon

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Quantitative Electron Microscopy and the Application by Single Electron Signals

Large-Scale Molecular Dynamics and High-Resolution Transmission Electron Microscopy Study of Graphene Grain Boundaries

Applications of Bicrystallography: Revealing Generic Similarities in Coincidence Site Lattice Boundaries of all Holohedral Cubic Materials and Facilitating the Design of 3D Printed Models of such Grain Boundaries

Defect Character at Grain Boundary Facet Junctions: A Combined HRSTEM and Atomistic Modeling Study of a Σ=5 Grain Boundary in Fe

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy

Application of EBSD and Precession-Enhanced Diffraction (PED) to Study Crystallography of P-Titanium Alloy During P→α Transformation under Severe Hot Plastic Deformation

Precession Electron Diffraction and Orientation Phase Mapping of Assembled Ag/ZnO Nanoantennas

A Precession Electron Diffraction and EELS Study of Beta-phase Evolution in Nano-crystalline Mg-9 wt.% Al Thin Films during Heat Treatment

Quantitative Phase Analysis of Rapid Solidification Products in Al-Cu Alloys by Automated Crystal Orientation Mapping in the TEM

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Electron Energy-Loss Spectroscopy of Organic Photovoltaics

Vibrational phonon spectroscopy of boron nitride polymorphs: a comparison between theory and experiment

Variable Angle Spectroscopic Ellipsometry and Electron Energy-Loss Spectroscopy

Detection and Characterization of OH Vibrational Modes using High Energy Resolution EELS

Study Using Low-loss EELS to Compare Properties of TMDs Produced by Mechanical and Liquid Phase Exfoliation

A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis

Abstract

Standardization and Metrology for Efficiency and Reliability in Microbeam Analysis - No pain, no gain

Characterizing the Geometric Detection Efficiency of EDX Detectors

Determination of the Effective EDS Detector Area Using Experimental and Theoretical X-ray Emission Yields

Energy Resolution of Modern EDS Spectrometers: Is the current ISO standard definition outdated?

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis

Abstract