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Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis

Published online by Cambridge University Press:  23 September 2015

Y. Fleming
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg
T. Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg
S. Eswara Moorthy
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

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[2] Wirtz, T., Fleming, Y., Gysin, U., Glatzel, T., Wegmann, U, Meyer, E., Maier, U. & Rychen, J., Surf Interface Anal 45(1), 513516 (2013).Google Scholar
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[4] Nguyen, C. L., Wirtz, T., Fleming, Y. & Metson, J. B., Appl. Surf. Sci 265, 489494 (2013).Google Scholar