Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-09T09:10:24.904Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlation between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification

Published online by Cambridge University Press:  26 July 2009

G Thompson ,
A Genc ,
R Morris ,
K Torres  and
HL Fraser
G Thompson
Affiliation:
University of Alabama
A Genc
Affiliation:
Ohio State University
R Morris
Affiliation:
University of Alabama
K Torres
Affiliation:
University of Alabama
HL Fraser
Affiliation:
Ohio State University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 250 - 251
Copyright
Copyright © Microscopy Society of America 2009