Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Brewer, Joseph R.
Jacobberger, Robert M.
Diercks, David R.
and
Cheung, Chin Li
2011.
Rare Earth Hexaboride Nanowires: General Synthetic Design and Analysis Using Atom Probe Tomography.
Chemistry of Materials,
Vol. 23,
Issue. 10,
p.
2606.
Gault, Baptiste
Moody, Michael P.
Cairney, Julie M.
and
Ringer, Simon P.
2012.
Atom Probe Microscopy.
Vol. 160,
Issue. ,
p.
71.
Du, Sichao
Burgess, Timothy
Tjing Loi, Shyeh
Gault, Baptiste
Gao, Qiang
Bao, Peite
Li, Li
Cui, Xiangyuan
Kong Yeoh, Wai
Hoe Tan, Hark
Jagadish, Chennupati
Ringer, Simon P.
and
Zheng, Rongkun
2013.
Full tip imaging in atom probe tomography.
Ultramicroscopy,
Vol. 124,
Issue. ,
p.
96.
Devaraj, Arun
Nag, Soumya
and
Banerjee, Rajarshi
2013.
Alpha phase precipitation from phase-separated beta phase in a model Ti–Mo–Al alloy studied by direct coupling of transmission electron microscopy and atom probe tomography.
Scripta Materialia,
Vol. 69,
Issue. 7,
p.
513.
Du, Sichao
Burgess, Timothy
Gault, Baptiste
Gao, Qiang
Bao, Peite
Li, Li
Cui, Xiangyuan
Kong Yeoh, Wai
Liu, Hongwei
Yao, Lan
Ceguerra, Anna V.
Hoe Tan, Hark
Jagadish, Chennupati
Ringer, Simon P.
and
Zheng, Rongkun
2013.
Quantitative dopant distributions in GaAs nanowires using atom probe tomography.
Ultramicroscopy,
Vol. 132,
Issue. ,
p.
186.
Diercks, David R.
Gorman, Brian P.
Kirchhofer, Rita
Sanford, Norman
Bertness, Kris
and
Brubaker, Matt
2013.
Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects.
Journal of Applied Physics,
Vol. 114,
Issue. 18,
Devaraj, A.
Colby, R.
Hess, W. P.
Perea, D. E.
and
Thevuthasan, S.
2013.
Role of Photoexcitation and Field Ionization in the Measurement of Accurate Oxide Stoichiometry by Laser-Assisted Atom Probe Tomography.
The Journal of Physical Chemistry Letters,
Vol. 4,
Issue. 6,
p.
993.
Miller, Michael K.
and
Forbes, Richard G.
2014.
Atom-Probe Tomography.
p.
189.
Alia, Shaun M.
Larsen, Brian A.
Pylypenko, Svitlana
Cullen, David A.
Diercks, David R.
Neyerlin, K.C.
Kocha, Shyam S.
and
Pivovar, Bryan S.
2014.
Platinum-Coated Nickel Nanowires as Oxygen-Reducing Electrocatalysts.
ACS Catalysis,
Vol. 4,
Issue. 4,
p.
1114.
Qu, Jiangtao
Ringer, Simon
and
Zheng, Rongkun
2015.
Atomic-scale tomography of semiconductor nanowires.
Materials Science in Semiconductor Processing,
Vol. 40,
Issue. ,
p.
896.
Lee, Hee-Sun
Lee, Jun-Young
and
Yeo, Jong-Souk
2015.
Transmission Electron Microscopy Sample Preparation of Ge2Sb2Te5 Nanowire Using Electron Beam.
Applied Microscopy,
Vol. 45,
Issue. 4,
p.
199.
Qu, Jiangtao
Wong, Derek
Du, Sichao
Yang, Limei
Ringer, Simon
and
Zheng, Rongkun
2015.
Methodology exploration of specimen preparation for atom probe tomography from nanowires.
Ultramicroscopy,
Vol. 159,
Issue. ,
p.
427.
Diercks, David R.
and
Gorman, Brian P.
2015.
Nanoscale Measurement of Laser-Induced Temperature Rise and Field Evaporation Effects in CdTe and GaN.
The Journal of Physical Chemistry C,
Vol. 119,
Issue. 35,
p.
20623.
Strand, Matthew B
Leong, G. Jeremy
Tassone, Christopher J.
Larsen, Brian
Neyerlin, K. C.
Gorman, Brian
Diercks, David R.
Pylypenko, Svitlana
Pivovar, Bryan
and
Richards, Ryan M.
2016.
Mechanistic Study of Shape-Anisotropic Nanomaterials Synthesized via Spontaneous Galvanic Displacement.
The Journal of Physical Chemistry C,
Vol. 120,
Issue. 43,
p.
25053.
Koelling, S.
Li, A.
Cavalli, A.
Assali, S.
Car, D.
Gazibegovic, S.
Bakkers, E. P. A. M.
and
Koenraad, P. M.
2017.
Atom-by-Atom Analysis of Semiconductor Nanowires with Parts Per Million Sensitivity.
Nano Letters,
Vol. 17,
Issue. 2,
p.
599.
Gries, Katharina Ines
Schlechtweg, Julian
Hille, Pascal
Schörmann, Jörg
Eickhoff, Martin
and
Volz, Kerstin
2017.
Three dimensional reconstruction of InGaN nanodisks in GaN nanowires: Improvement of the nanowire sample preparation to avoid missing wedge effects.
Journal of Crystal Growth,
Vol. 475,
Issue. ,
p.
202.
Makineni, S. K.
Lenz, M.
Kontis, P.
Li, Z.
Kumar, A.
Felfer, P. J.
Neumeier, S.
Herbig, M.
Spiecker, E.
Raabe, D.
and
Gault, B.
2018.
Correlative Microscopy—Novel Methods and Their Applications to Explore 3D Chemistry and Structure of Nanoscale Lattice Defects: A Case Study in Superalloys.
JOM,
Vol. 70,
Issue. 9,
p.
1736.
Chang, Alexander S.
and
Lauhon, Lincoln J.
2018.
Atom probe tomography of nanoscale architectures in functional materials for electronic and photonic applications.
Current Opinion in Solid State and Materials Science,
Vol. 22,
Issue. 5,
p.
171.
Devaraj, Arun
Perea, Daniel E.
Liu, Jia
Gordon, Lyle M.
Prosa, Ty. J.
Parikh, Pritesh
Diercks, David R.
Meher, Subhashish
Kolli, R. Prakash
Meng, Ying Shirley
and
Thevuthasan, Suntharampillai
2018.
Three-dimensional nanoscale characterisation of materials by atom probe tomography.
International Materials Reviews,
Vol. 63,
Issue. 2,
p.
68.
Diercks, David R.
and
Gorman, Brian P.
2018.
Self-consistent atom probe tomography reconstructions utilizing electron microscopy.
Ultramicroscopy,
Vol. 195,
Issue. ,
p.
32.