Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires

D Diercks; BP Gorman; CL Cheung; G Wang

doi:10.1017/S1431927609093398

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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Diercks, David R. and Gorman, Brian P. 2015. Nanoscale Measurement of Laser-Induced Temperature Rise and Field Evaporation Effects in CdTe and GaN. The Journal of Physical Chemistry C, Vol. 119, Issue. 35, p. 20623.

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Devaraj, Arun Perea, Daniel E. Liu, Jia Gordon, Lyle M. Prosa, Ty. J. Parikh, Pritesh Diercks, David R. Meher, Subhashish Kolli, R. Prakash Meng, Ying Shirley and Thevuthasan, Suntharampillai 2018. Three-dimensional nanoscale characterisation of materials by atom probe tomography. International Materials Reviews, Vol. 63, Issue. 2, p. 68.

Makineni, S. K. Lenz, M. Kontis, P. Li, Z. Kumar, A. Felfer, P. J. Neumeier, S. Herbig, M. Spiecker, E. Raabe, D. and Gault, B. 2018. Correlative Microscopy—Novel Methods and Their Applications to Explore 3D Chemistry and Structure of Nanoscale Lattice Defects: A Case Study in Superalloys. JOM, Vol. 70, Issue. 9, p. 1736.

Diercks, David R. and Gorman, Brian P. 2018. Self-consistent atom probe tomography reconstructions utilizing electron microscopy. Ultramicroscopy, Vol. 195, Issue. , p. 32.

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Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires

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