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Sensitivity And Quantitativity In Atom Probe Tomography

Published online by Cambridge University Press:  26 July 2009

F Danoix ,
A Bostel ,
A Leitner ,
P Jessner ,
X Sauvage ,
M Gouné  and
R Danoix
F Danoix
Affiliation:
Université de Rouen,France
A Bostel
Affiliation:
Université de Rouen,France
A Leitner
Affiliation:
Montanuniversität Leoben,Austria
P Jessner
Affiliation:
Université de Rouen,France
X Sauvage
Affiliation:
Université de Rouen,France
M Gouné
Affiliation:
ArcelorMittal, France
R Danoix
Affiliation:
Université de Rouen,France

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 258 - 259
Copyright
Copyright © Microscopy Society of America 2009