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Volume 15 - Supplement S2 - July 2009

Contents

Page 17 of 39

Instrumentation and Techniques

Three-Dimensional Imaging in the Biological and Materials Sciences: Bridging Nano and Micron Scales

Abstract

  • Analysis of Simian Virus 40 Chromatin Structure by Cryo-Electron Tomography

  • P Keller, O Ben-Nun Shaul, B Heymann, D Winkler, A Oppenheim, AC Steven
  • Published online by Cambridge University Press:
    26 July 2009, pp. 644-645
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron-Tomography of a Temperature-Sensitive Morphogenic Mutant of Rous Sarcoma Virus (RSV)

  • C Butan, PM Lokhandwala, DC Winkler, RC Craven, AC Steven
  • Published online by Cambridge University Press:
    26 July 2009, pp. 646-647
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

High Resolution Scanning Microscopy - Ions to Electrons

Abstract

  • Choosing a Beam-Electrons,Protons, He or Ga ions?

  • DC Joy, R Ramachandra, BJ Griffin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 648-649
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images

  • LA Giannuzzi, M Utlaut
  • Published online by Cambridge University Press:
    26 July 2009, pp. 650-651
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • One Year On: New and Unique Applications of He Ion Microscopy

  • DC Bell, N Erdman, MA Jepson, C Rodenburg, BJ Inkson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 652-653
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Advances in High Resolution Helium Ion Microscope (HIM) Imaging

  • C Sanford, J Notte, L Scipioni, S McVey, R Hill, S Sijbrandij, L Farkas
  • Published online by Cambridge University Press:
    26 July 2009, pp. 654-655
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Superior Imaging Quality of Scanning Helium-Ion Microscopy: a Look at Beam-Sample Interactions,

  • D Cohen-Tanugi, N Yao
  • Published online by Cambridge University Press:
    26 July 2009, pp. 656-657
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Precision Material Modification and Patterning with Helium Ions

  • DC Bell, M Lemme, CM Marcus
  • Published online by Cambridge University Press:
    26 July 2009, pp. 658-659
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Challenges in Achieving High Resolution at Low Voltages in the SEM

  • JR Michael, DC Joy, BJ Griffin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 660-661
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Study of the Behavior of SE and BSE in UltraLow Landing Voltage Condition

  • A Miyaki, S Takeuchi, A Muto, Y Dan, T Sawahata, M Nakagawa, T Teranishi, Y Majima
  • Published online by Cambridge University Press:
    26 July 2009, pp. 662-663
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Challenges in Low Voltage Imaging in the FE-SEM

  • R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 664-665
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Can X-ray Spectrum Imaging (XSI) Replace Backscattered Electron (BSE) Imaging for Compositional Contrast in the Scanning Electron Microscope?

  • DE Newbury
  • Published online by Cambridge University Press:
    26 July 2009, pp. 666-667
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reference Material (RM) 8820: A New Scanning Electron Microscope Scale Calibration Artifact

  • AE Vladár, MT Postek
  • Published online by Cambridge University Press:
    26 July 2009, pp. 668-669
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Imaging Fundamental Electronic Excitations at High Spatial Resolution Using Scanning Cathodoluminescence Microscopy

  • MR Phillips, D Drouin, SJ Moody, C Ton-That
  • Published online by Cambridge University Press:
    26 July 2009, pp. 670-671
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film

  • H Demers, E Lifshin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 672-673
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

In Situ Microscopy: Real Time Correlation of Structure, Processing, and Properties

Abstract

  • In-Situ Microstructure Evolution Under Stress Using a Large-Chamber SEM

  • R Woracek, S Young, D Penumadu, JJ Frafjord
  • Published online by Cambridge University Press:
    26 July 2009, pp. 676-677
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Orientation Imaging of Recrystallization and Grain Growth in OFHC Copper

  • MM Nowell, SI Wright, JO Carpenter
  • Published online by Cambridge University Press:
    26 July 2009, pp. 678-679
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A High Temperature ESEM Investigation into the Separation of MgCl2 from MgCl2 - Ti Mixture

  • AM Glenn, C Doblin, CM MacRae
  • Published online by Cambridge University Press:
    26 July 2009, pp. 680-681
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • An ESEM Study of the Influence of Humidity in the Integrity of Mascara Films

  • GA Camacho-Bragado, FM Dixon, NJ Zaluzec
  • Published online by Cambridge University Press:
    26 July 2009, pp. 682-683
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 17 of 39