Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 15 supplement s2
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 15 - Supplement S2 - July 2009

Contents

Page 20 of 39

Instrumentation and Techniques

Electron Diffraction and Imaging Techniques for Quantitative Structure Determination

Abstract

  • Quantitative Analysis Carbon-Carbon Bonds in a Multiwall Carbon Nanotube using Electron Diffraction

  • J Zhang, J-M Zuo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 764-765
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determination of Crystal Structure from Electron Backscatter Diffraction Patterns

  • SI Wright, DJ Dingley, MM Nowell
  • Published online by Cambridge University Press:
    26 July 2009, pp. 766-767
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Technique for Fitting Complex Probes in Nano-Beam Diffraction

  • R McLeod, M Malac
  • Published online by Cambridge University Press:
    26 July 2009, pp. 768-769
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanometer Scale Atomic Order in a Bulk Metallic Glass from Fluctuation Microscopy

  • J Hwang, P Voyles
  • Published online by Cambridge University Press:
    26 July 2009, pp. 770-771
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Analysis of Point Defects in an Ideal Quasicrystal by Aberration-Corrected Z-Contrast STEM

  • E Abe, T Seki, SJ Pennycook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 772-773
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determining Projected Symmetries for Structural Fingerprinting of Nanocrystals

  • P Moeck, S Rouvimov
  • Published online by Cambridge University Press:
    26 July 2009, pp. 776-777
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Metallographic Techniques & Materials Characterization

Abstract

  • Quantitative Evaluation of Metallographic Preparation Quality using EBSD

  • PT Pinard, P Hovington, M Lagacé, GM Lucas, GF Vander Voort, R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 778-779
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Methods of Evaluating EBSD Sample Preparation

  • MM Nowell, SI Wright, JO Carpenter, R Witt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 780-781
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Observing Solidification Patterns in Rapidly Solidified Alloys and Powders

  • J Steele
  • Published online by Cambridge University Press:
    26 July 2009, pp. 782-783
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Failure Analysis and Design of Cu-Be Alloy Clips

  • F Schmidt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 784-785
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electrolytic Polishing of Cold Worked Zr-2.5Nb for the Examination of Zr-Hydrides

  • A Lockley
  • Published online by Cambridge University Press:
    26 July 2009, pp. 788-789
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Ion-Beam Etching Techniques in Uranium Metallography

  • JJ Frafjord, RL Bridges, SJ Dekanich
  • Published online by Cambridge University Press:
    26 July 2009, pp. 790-791
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Observation of Twin Evolution in Austenitic TWIP steel

  • J Han, M Kim, HN Han
  • Published online by Cambridge University Press:
    26 July 2009, pp. 792-793
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Study of Lizardite-1T Particles in Toluene Solvent

  • J Yan, XZ Li, JY Jiang, L Tan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 794-795
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Microscopy and Analysis in Forensic Science

Abstract

  • Applications of Microscopy and Microanalysis in US FDA Forensic Cases

  • SF Platek, JB Crowe, N Ranieri, M Witkowski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 796-797
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Forensic Science Scanning Electron Microscopy, and News in this Field

  • M Kotrly, I Turkova, V Grunwaldova
  • Published online by Cambridge University Press:
    26 July 2009, pp. 798-799
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Study of Down-Range GSR Deposition as a Function of Firearms Type and Ammunition Caliber

  • AJ Schwoeble
  • Published online by Cambridge University Press:
    26 July 2009, pp. 800-801
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Raw Data and Metadata: Comprehensive and Ethical Collection, Storage, Manipulation and Retrieval of Images

Abstract

  • Securing and Authenticating Images with On-Image Metadata

  • C Bradley, J Mancuso
  • Published online by Cambridge University Press:
    26 July 2009, pp. 802-803
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 20 of 39