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Volume 15 - Supplement S2 - July 2009

Contents

Page 18 of 39

Instrumentation and Techniques

In Situ Microscopy: Real Time Correlation of Structure, Processing, and Properties

Abstract

  • In-Situ Tensile-Creep Deformation Observations of a Cobalt-based Superalloy

  • S Longanbach, C Boehlert
  • Published online by Cambridge University Press:
    26 July 2009, pp. 684-685
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Liquid and Three-Dimensional Scanning Transmission Electron Microscopy for Biological Specimen

  • N de Jonge, MJ Dukes, GJ Kremers, BM Northan, DB Peckys, EA Ring, DW Piston, R Sougrat
  • Published online by Cambridge University Press:
    26 July 2009, pp. 686-687
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Synthesis of PtSn/C Fuel Cell Nanocatalysts in Aberration-Corrected TEM/STEM

  • J Liu, J Braddock-Wilking, LF Allard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 688-689
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ TEM Characterization of Nucleation and Growth of Nanopatterned Oxides

  • A Yan, T Sun, VP Dravid
  • Published online by Cambridge University Press:
    26 July 2009, pp. 690-691
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Observation of Au/TiO2 Catalyst in Oxygen-Gas Environments

  • T Tanaka, K Sano, M Ando, H Sawada, F Hosokawa, E Okunishi, Y Kondo, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 692-693
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Resolution In-Situ Heating TEM Study of Nanocrystals

  • XF Zhang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 694-695
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Imaging Particle Analysis Using a High Resolution In-Flow Imaging Flow Cytometer with Oil Immersion Optics

  • L Brown, C Sieracki
  • Published online by Cambridge University Press:
    26 July 2009, pp. 696-697
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ TEM Observation of Metal Zn Nanocrystal Growth on ZnO Films

  • JM Yuk, K Kim, Z Lee, M Watanabe, A Zettl, JY Lee, YS No, TW Kim, WK Choi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 698-699
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nano-Scale Compositional Heterogeneity in Pr-doped CeO2

  • V Sharma, K Eberhardt, R Sharma, P Crozier
  • Published online by Cambridge University Press:
    26 July 2009, pp. 700-701
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Tensile Observation of Deformation Twin in TWIP Steel Using TEM

  • S-I Baik, T-Y Ahn, W-P Hong, Y-S Jung, Y-K Lee, Y-W Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 702-703
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Size Effects on the Melting Temperature of Silver Nanoparticles: In-Situ TEM Observations

  • M Asoro, J Damiano, PJ Ferreira
  • Published online by Cambridge University Press:
    26 July 2009, pp. 706-707
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Electrical Measurements of Vertically Aligned Nanostructures

  • G McMahon, T Paudel, ZF Ren, MJ Naughton
  • Published online by Cambridge University Press:
    26 July 2009, pp. 708-709
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During its Manipulation, Deformation and Growth

  • C Jin, K Suenaga, S Iijima
  • Published online by Cambridge University Press:
    26 July 2009, pp. 710-711
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ TEM Characterization of the Effect of Interfaces on Charge Transport in Cu(In,Ga)Se2 Thin Film Solar Cells

  • G Östberg, E Yucelen, K Svensson, E Olsson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 712-713
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Titan Environmental Transmission Electron Microscope: Specifications, Considerations and First Results

  • TW Hansen, JB Wagner, JR Jinschek, RE Dunin-Borkowski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 714-715
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Observation and Characterization of Structural Evolution in a Phase-Change Memory Device by TEM-STM

  • D Cha, SY Park, SJ Ahn, H Horii, DK Kim, YK Kim, SO Park, UI Jung, MJ Kim, J Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 716-717
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ and Ex-Situ Electron Microscopy and Spectroscopy Investigation of Capacity Fade Mechanisms of Rechargeable Li-S Batteries

  • VP Oleshko, C Scordilis-Kelley, A Xiao
  • Published online by Cambridge University Press:
    26 July 2009, pp. 718-719
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Observation of the Reaction Between Iron and Carbon in TEM

  • N Ishikawa, T Aoyagi, T Kimura, K Furuya, T Harada, T Inami
  • Published online by Cambridge University Press:
    26 July 2009, pp. 720-721
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Fracture of Silicon Nanoparticles

  • JD Nowak, AR Beaber, O Ugurlu, WW Gerberich, OL Warren
  • Published online by Cambridge University Press:
    26 July 2009, pp. 722-723
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 18 of 39