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Volume 15 - Supplement S2 - July 2009

Contents

Page 19 of 39

Instrumentation and Techniques

In-Situ Microscopy: Real Time Correlation of Structure, Processing, and Properties

Abstract

  • In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias

  • C Winkler, L Martin, C Johnson, M Taheri
  • Published online by Cambridge University Press:
    26 July 2009, pp. 724-725
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ and Ex-situ TEM Imaging and Spectroscopy Study of Li-Ion Battery

  • CM Wang, W Xu, ZM Nie, D Choi, DH Wang, ZG Yang, JG Zhang, S Thevuthasan, J Liu, DR Baer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 726-727
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microtomography Versus Optical Microscopy in the Examination of Interior Features in Ice

  • R Obbard, I Baker
  • Published online by Cambridge University Press:
    26 July 2009, pp. 728-729
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determination of Sintering Parameters from In-Situ Aberration-Corrected STEM Imaging of Coalescence in Pt Nanoparticles

  • M Asoro, Y Shao-Horn, D Kovar, LF Allard, PJ Ferreira
  • Published online by Cambridge University Press:
    26 July 2009, pp. 730-731
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanocharacterization and Control of Supported Ni Nanocatalysts for Partial Oxidation of Methane

  • R Banerjee, S Chenna, P Crozier
  • Published online by Cambridge University Press:
    26 July 2009, pp. 732-733
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Tribology Study of Nanoprobe Sliding on Defective Crystalline Surface

  • Y Liao, LD Marks
  • Published online by Cambridge University Press:
    26 July 2009, pp. 734-735
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Are Dislocations Present in Nanoparticles?: Fourier Filtering of Images Obtained From In-Situ TEM Nanoindentation

  • C Carlton, PJ Ferreira
  • Published online by Cambridge University Press:
    26 July 2009, pp. 736-737
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Electron Diffraction and Imaging Techniques for Quantitative Structure Determination

Abstract

  • Towards Routine Structure Solution using Precession Electron Diffraction

  • PA Midgley, A Eggeman, T White, E Bithell
  • Published online by Cambridge University Press:
    26 July 2009, pp. 738-739
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic-Resolution Imaging of Crystals Using Charge Flipping and Precession Electron Diffraction

  • H Hu, J-M Zuo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 740-741
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Ab Initio Undersampled Phase Retrieval

  • S Marchesini
  • Published online by Cambridge University Press:
    26 July 2009, pp. 742-743
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reconstruction of Atomic Columns in Silicon by Electron Diffractive Imaging

  • S Morishita, J Yamasaki, K Nakamura, T Kato, N Tanaka
  • Published online by Cambridge University Press:
    26 July 2009, pp. 744-745
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 10-kV Electron-Diffractive Imaging of Multiwall Carbon Nanotube

  • O Kamimura, T Dobashi, K Kawahara, Y Maehara, K Gohara
  • Published online by Cambridge University Press:
    26 July 2009, pp. 746-747
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Diffractive Imaging of a Single Nanoparticle

  • F-R Chen, R Dronyak, C-K Feng, KS Liang, T-K Lee
  • Published online by Cambridge University Press:
    26 July 2009, pp. 748-749
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A STEM Parallel Diffraction Technique Applied to Nanomaterials

  • KJ Ganesh, M Kawasaki, JP Zhou, PJ Ferreira
  • Published online by Cambridge University Press:
    26 July 2009, pp. 752-753
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fast Multislice Simulation of Scanning Transmission Electron Microscope Images

  • C Dwyer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 754-755
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Throughput Automated Crystal Orientation and Phase Mapping of Nanoparticles from HREM - TEM Images

  • EF Rauch, S Rouvimov, S Nicolopoulos, P Moeck
  • Published online by Cambridge University Press:
    26 July 2009, pp. 756-757
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanocrystal Structure Determination by Kinematic Convergent-Beam Electron Diffraction

  • JT McKeown, JCH Spence
  • Published online by Cambridge University Press:
    26 July 2009, pp. 758-759
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Diffraction from Liquids Jets in TEM

  • DP DePonte, JT McKeown, M Hunter, RB Doak, U Weierstall, JCH Spence
  • Published online by Cambridge University Press:
    26 July 2009, pp. 762-763
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 19 of 39