Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film

H Demers; E Lifshin

doi:10.1017/S1431927609096093

Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film

Published online by Cambridge University Press: 26 July 2009

H Demers and

E Lifshin

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H Demers: Affiliation:
SUNY,Albany
E Lifshin: Affiliation:
SUNY,Albany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 672 - 673

DOI: https://doi.org/10.1017/S1431927609096093 [Opens in a new window]

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Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film

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