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Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film

Published online by Cambridge University Press:  26 July 2009

H Demers  and
E Lifshin
H Demers
Affiliation:
SUNY,Albany
E Lifshin
Affiliation:
SUNY,Albany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 672 - 673
Copyright
Copyright © Microscopy Society of America 2009