Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy

Nanocrystalline Diamond in Ru-DOPED DLC Films

Deposition of Au Nanocrystals on TiO2 Crystallites

Composition-Size Diagrams of Supported Pt-Sn Catalysts

High Resolution Tem Observation and Eels Analysis of Carbon Nanotubes at Elevated Temperatures

Characteristics of Palladium Particles on Tin Dioxide Thin Films Studied by Transmission Electron Microscopy

Microstructural Studies of Copper Sulfide Film Growth: Influence of Humidity

Electron Microscopy Study of Fe3O4(111)/MgO(111) Polar Oxide Interface

Hrtem Characterization of Interface Between ISO-Structural Thin Solid Film and Substrate

Strain Relaxation by Misfit Dislocations in Nanoscale Epitaxial Ferroelectric BaTiO3 Films Grown on SrTiO3 Substrate

Layer and Defect Structures of BaF2/CaF2 Multilayers

Nanoscale Grain Boundary Dissociation: Role of Shockley Partial Dislocations

Aliovalent Dopant Distribution in Nanocrystalline Tin Dioxide Thin Films Studied by XRay Energy Dispersive Spectroscopy

Grain Boundary Segregation in Titanium Dioxide

Charging of a Structured Material during Electron Beam Exposure

Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.

Observation of device cross-sectional thin films prepared by FIB using JEM-2500SE, an electron microscope for nano-analysis

Nanoscale Compositional Characterization of Silicon Oxide-Nitride-Oxide Stacks

TEM Observation on Single Defect in SiC

Microanalysis of Nano-Crystalline Diamonds

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract