Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

Assessment of Integrated Sub-Micron Polysilicon Fuses for Low Voltage CMOS Applications

Ion Channeling Contrast Imaging of Aluminum Wire Bonds

Quantum Wire Arrays in Compositionally Modulated InAs/AlAs Superlattices

Z-Contrast Imaging of InAs Quantum Wires In GaAs/ALAs Quantum Wells

Energy Dispersive Spectrometry Calibration For The HD -2000 STEM

EFTEM Mapping of Copper - Porous SiLK Structures

Tem Study of The Microstructure of Si Thin Films Deposited by Hot Wire CVD

Screw Dislocations in GaN

Evolution of GaSb/GaAs Quantum Dot Strain Relaxation

Cracking of GaN Based III-Nitride Heterostructures Grown by MOVPE on (0001)-6H-SiC

Characterization and Optimization of Semiconductor Specimen Preparation for QHREM

Electrical and Structural Characterization of GaN p-n Heterostuctures by Scanning Probe Microscopy

Measurements of GaN-Based Heterostructures with Electron Beam Induced Current

A Novel Method for Direct TEM Study of Microstructure of Polysilicon Films Crystallized with and without Underlying Oxide

Applications of a Novel FIB-SIMS Instrument in SIMS Image Depth Profiling

CuPt-Type Ordering of MOCVD In0.49Al0.51P

Electron Diffraction Evidence For An Elastic XY Model Phase In Niobia-Zirconia Ceramic Alloys

Local Symmetry and Phason Fluctuations of an Ideal Al-Ni-Co Quasicrystal Studied by Atomic-resolution HAADF-STEM

Direct Observation of Icosahedral Clusters in Quasicrystals and Crystals

In Segregation and Phase Separation In Multilayer Structures

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract