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Characterization of Nanoparticle Films and Structures Using Focused Ion Beam Milling and Transmission Electron Microscopy

Published online by Cambridge University Press:  01 November 2002

C. R. Perrey ,
C. B. Carter ,
P. G. Kotula  and
J. R. Michael
C. R. Perrey
Affiliation:
Department. of Chemical Engineering and Materials Science, University of Minnesota 421 Washington Avenue S.E., Minneapolis, MN 55455-0132
C. B. Carter
Affiliation:
Department. of Chemical Engineering and Materials Science, University of Minnesota 421 Washington Avenue S.E., Minneapolis, MN 55455-0132
P. G. Kotula
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-0886
J. R. Michael
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-0886

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1144 - 1145
Copyright
Copyright © Microscopy Society of America 2002