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Strain Relaxation by Misfit Dislocations in Nanoscale Epitaxial Ferroelectric BaTiO3 Films Grown on SrTiO3 Substrate

Published online by Cambridge University Press:  01 August 2002

H. P. Sun ,
W. Tian ,
J. H. Haeni ,
D. G. Schlom  and
X. Q. Pan
H. P. Sun
Affiliation:
Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109
W. Tian
Affiliation:
Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109
J. H. Haeni
Affiliation:
Dept. of Materials Science and Engineering, Penn. State University, University Park, PA 16802
D. G. Schlom
Affiliation:
Dept. of Materials Science and Engineering, Penn. State University, University Park, PA 16802
X. Q. Pan
Affiliation:
Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1162 - 1163
Copyright
Copyright © Microscopy Society of America 2002