Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

3-D Electron Microscopy for Nano-Technology and the IC Industry

A New High-Resolution Electron Microscope with Easy Operation System for Nano Analysis

Atomic Resolution Images Using Forbidden Reflections on (111) Face Centered Cubic Nanoparticles

HRTEM Studies of Morphological and Interfacial Changes of Nanodiamond in Field Emission Experiments

TEM Study of Metal/Support Interaction in Pd/CexZr1-xO2 Model Auto Catalyst

Atomic Scale Structural Analysis of Sn-Si Quantum Dots

Virus Nanoblocks for Molecular Electronics

“On-Chip” NanoFabricated Collagen Membranes Observed by High-Voltage Electron Microscopy

Enhanced Quality Nanocrystalline Metal Films Produced By Dendrimer Mediated Thin Film Growth

Ag Nanostructure Evolution on H-terminated Si(111) Surfaces

Spontaneous Self-Organisation Of Gold Nanoparticles Into Ordered Two-Dimensional Arrays

Atom Probe Tomography: A Technique for Nanoscale Characterization

TEM Characterization of WS2 Nanotubes

TEM Nanostructure Manipulation Device for in Situ Study of Elastic Behavior of Nanoparticle Chain Aggregates

Low Voltage FESEM Evaluation of Nano and Microfabricated Materials

TEM Image Analysis of Self-Organized Large Gold Nanoparticle Arrays

Nanoscale Structural Manipulation of Ion Irradiated Pyrochlore

AFM Analysis of Gas Cluster Ion Impact Craters and Smoothing

Field Effects on Particle Assembly in Composite Needle Systems

Focused Ion Beam Assisted Nanofabrication – Patterned Growth of Carbon Nanotubes

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract